Tailoring electrical conductivity and mechanism of carrier transport in zinc oxide with embedded Ag layer

Hauk Han, N. D. Theodore, Terry Alford

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The effects of an embedded silver layer on the electrical properties of zinc oxide (ZnO) / silver (Ag)/ zinc oxide (ZnO) layered composite structures on polymer substrates have been investigated. We have engineered transparent conducting oxide structures with greatly improved conductivity. Electrical properties are correlated with Ag thickness. Film thicknesses were determined using Rutherford backscattering spectrometry. Hall effect, 4-point probe, and UV-Vis spectrophotometer analyses were used to characterize electrical and optical properties. The results show that carrier concentration, mobility, and conductivity increase with Ag thickness. Increasing Ag thickness from 8 to 14 nm enhances sheet resistance and resistivity by six orders of magnitude. We describe of the influence of Ag thickness on electrical properties of the ZnO/Ag/ZnO composite and propose a conduction mechanism for this system.

Original languageEnglish (US)
Title of host publicationSynthesis and Metrology of Nanoscale Oxides and Thin Films
PublisherMaterials Research Society
Pages167-173
Number of pages7
ISBN (Print)9781605608556
DOIs
StatePublished - Jan 1 2008
Event2008 MRS Spring Meeting - San Francisco, CA, United States
Duration: Mar 24 2008Mar 28 2008

Publication series

NameMaterials Research Society Symposium Proceedings
Volume1074
ISSN (Print)0272-9172

Other

Other2008 MRS Spring Meeting
CountryUnited States
CitySan Francisco, CA
Period3/24/083/28/08

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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