Fingerprint
Dive into the research topics of 'System-level analysis of single event upset susceptibility in RRAM architectures'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
System-level analysis of single event upset susceptibility in RRAM architectures
Rui Liu, Hugh Barnaby, Shimeng Yu
- Connection One (C1)
- Embedded Systems, Consortium for (CES)
- Electrical, Computer, and Energy Engineering, School of (IAFSE-ECEE)
- Applied Nanoionics, Center for (CANi)
- Solid State Electronics Research Center (CSSER)
- Electrical Engineering
- Engineering, Ira A. Fulton Schools of (IAFSE)
- Computing and Augmented Intelligence, School of (IAFSE-SCAI)
- Computer Science and Engineering
Research output: Contribution to journal › Article › peer-review
7
Scopus
citations