Synchrotron X-ray diffraction observation of phase transformation during annealing of Si processed by high-pressure torsion

Yoshifumi Ikoma, Terumasa Yamasaki, Takahiro Masuda, Yoshinori Tange, Yuji Higo, Yasuo Ohishi, Martha R. McCartney, David J. Smith, Zenji Horita

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

In situ observation of a phase transformation during annealing of Si containing diamond-cubic (dc) and metastable phases has been performed using synchrotron X-ray diffraction. Metastable body-centred-cubic (bc8) and rhombohedral (r8) phases were formed by high-pressure torsion. These metastable phases gradually disappeared when increasing the annealing temperature to ∼ 180°C while another metastable phase having a hexagonal diamond (hd) structure appeared at ∼ 190°C. High-resolution transmission microscopy analysis revealed that hd and dc grains were present after annealing at 200°C. The results indicate that a phase transformation, mainly from bc8 to hd, occurred during annealing.

Original languageEnglish (US)
Pages (from-to)223-231
Number of pages9
JournalPhilosophical Magazine Letters
Volume101
Issue number6
DOIs
StatePublished - 2021

Keywords

  • Severe plastic deformation
  • metastable phases
  • phase transformation
  • semiconductors
  • synchrotron radiation

ASJC Scopus subject areas

  • Condensed Matter Physics

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