Synchrotron soft X-ray and field-emission electron sources: A comparison

John Spence, M. R. Howells

Research output: Contribution to journalArticle

27 Citations (Scopus)

Abstract

The soft X-ray spectral region and the useful range of electron energy-loss spectroscopy are very similar, both including the energy range 100-1000eV. Moreover, well-developed monochromators and parallel detection devices with comparable resolution exist for both. Despite the differing interactions of electrons and photons, many complementary experiments in imaging, spectroscopy and diffraction have been performed using both techniques. We therefore compare the brightness, degeneracy, monochromaticity, beam size, source size, spatial and temporal coherence of field-emission electron beams and soft X-ray synchrotron radiation from typical undulators. Recent brightness values for nanotip field emitters and undulators, both measured and calculated, are provided with examples from the Advanced Light Source synchrotron-radiation facility at Berkeley USA. The quantum mechanical upper limit on source brightness, as well as relationships among beam brightness, coherence parameters, and degeneracy, are discussed. Factors which limit these parameters and methods of measurement are reviewed, and the implications for diffraction, imaging and spectroscopic experiments as well as radiation damage are briefly commented on.

Original languageEnglish (US)
Pages (from-to)213-222
Number of pages10
JournalUltramicroscopy
Volume93
Issue number3-4
DOIs
StatePublished - Dec 2002

Fingerprint

Electron sources
electron sources
Synchrotrons
Field emission
field emission
Luminance
synchrotrons
brightness
X rays
Wigglers
Synchrotron radiation
Light sources
synchrotron radiation
x rays
Diffraction
Nanotips
Imaging techniques
Monochromators
Electron energy loss spectroscopy
Radiation damage

Keywords

  • Field-emission electron guns
  • Synchrotron soft X-ray

ASJC Scopus subject areas

  • Materials Science(all)
  • Instrumentation

Cite this

Synchrotron soft X-ray and field-emission electron sources : A comparison. / Spence, John; Howells, M. R.

In: Ultramicroscopy, Vol. 93, No. 3-4, 12.2002, p. 213-222.

Research output: Contribution to journalArticle

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