Synchrotron-based microanalysis of iron distribution after thermal processing and predictive modeling of resulting solar cell efficiency

D. P. Fenning; J. Hofstetter; M. I. Bertoni; J. F. Lelièvre; C. Del Cañizo; T. Buonassisi

doi:10.1109/PVSC.2010.5616767

Synchrotron-based microanalysis of iron distribution after thermal processing and predictive modeling of resulting solar cell efficiency

D. P. Fenning, J. Hofstetter, M. I. Bertoni, J. F. Lelièvre, C. Del Cañizo, T. Buonassisi

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Scopus citations

Abstract

Synchrotron-based X-ray fluorescence microscopy is applied to study the evolution of iron silicide precipitates during phosphorus diffusion gettering and low-temperature annealing. Heavily Fe-contaminated ingot border material contains FeSi2 precipitates after rapid in-line P-diffusion firing, suggesting kinetically limited gettering in these regions. An impurity-to-efficiency (I2E) gettering model is developed to explain the results. The model demonstrates the efficacy of high- and medium-temperature processing on reducing the interstitial iron population over a range of process parameters available to industry.

Original language	English (US)
Title of host publication	Program - 35th IEEE Photovoltaic Specialists Conference, PVSC 2010
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	430-431
Number of pages	2
ISBN (Print)	9781424458912
DOIs	https://doi.org/10.1109/PVSC.2010.5616767
State	Published - 2010
Externally published	Yes

Publication series

Name	Conference Record of the IEEE Photovoltaic Specialists Conference
ISSN (Print)	0160-8371

ASJC Scopus subject areas

Control and Systems Engineering
Industrial and Manufacturing Engineering
Electrical and Electronic Engineering

Access to Document

10.1109/PVSC.2010.5616767

Cite this

Fenning, D. P., Hofstetter, J., Bertoni, M. I., Lelièvre, J. F., Del Cañizo, C., & Buonassisi, T. (2010). Synchrotron-based microanalysis of iron distribution after thermal processing and predictive modeling of resulting solar cell efficiency. In Program - 35th IEEE Photovoltaic Specialists Conference, PVSC 2010 (pp. 430-431). Article 5616767 (Conference Record of the IEEE Photovoltaic Specialists Conference). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PVSC.2010.5616767

Synchrotron-based microanalysis of iron distribution after thermal processing and predictive modeling of resulting solar cell efficiency. / Fenning, D. P.; Hofstetter, J.; Bertoni, M. I. et al.
Program - 35th IEEE Photovoltaic Specialists Conference, PVSC 2010. Institute of Electrical and Electronics Engineers Inc., 2010. p. 430-431 5616767 (Conference Record of the IEEE Photovoltaic Specialists Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Fenning, DP, Hofstetter, J, Bertoni, MI, Lelièvre, JF, Del Cañizo, C & Buonassisi, T 2010, Synchrotron-based microanalysis of iron distribution after thermal processing and predictive modeling of resulting solar cell efficiency. in Program - 35th IEEE Photovoltaic Specialists Conference, PVSC 2010., 5616767, Conference Record of the IEEE Photovoltaic Specialists Conference, Institute of Electrical and Electronics Engineers Inc., pp. 430-431. https://doi.org/10.1109/PVSC.2010.5616767

Fenning DP, Hofstetter J, Bertoni MI, Lelièvre JF, Del Cañizo C, Buonassisi T. Synchrotron-based microanalysis of iron distribution after thermal processing and predictive modeling of resulting solar cell efficiency. In Program - 35th IEEE Photovoltaic Specialists Conference, PVSC 2010. Institute of Electrical and Electronics Engineers Inc. 2010. p. 430-431. 5616767. (Conference Record of the IEEE Photovoltaic Specialists Conference). doi: 10.1109/PVSC.2010.5616767

Fenning, D. P. ; Hofstetter, J. ; Bertoni, M. I. et al. / Synchrotron-based microanalysis of iron distribution after thermal processing and predictive modeling of resulting solar cell efficiency. Program - 35th IEEE Photovoltaic Specialists Conference, PVSC 2010. Institute of Electrical and Electronics Engineers Inc., 2010. pp. 430-431 (Conference Record of the IEEE Photovoltaic Specialists Conference).

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AB - Synchrotron-based X-ray fluorescence microscopy is applied to study the evolution of iron silicide precipitates during phosphorus diffusion gettering and low-temperature annealing. Heavily Fe-contaminated ingot border material contains FeSi2 precipitates after rapid in-line P-diffusion firing, suggesting kinetically limited gettering in these regions. An impurity-to-efficiency (I2E) gettering model is developed to explain the results. The model demonstrates the efficacy of high- and medium-temperature processing on reducing the interstitial iron population over a range of process parameters available to industry.

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Synchrotron-based microanalysis of iron distribution after thermal processing and predictive modeling of resulting solar cell efficiency

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