Synchrotron-based microanalysis of iron distribution after thermal processing and predictive modeling of resulting solar cell efficiency

D. P. Fenning, J. Hofstetter, Mariana Bertoni, J. F. Lelièvre, C. Del Cañizo, T. Buonassisi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Synchrotron-based X-ray fluorescence microscopy is applied to study the evolution of iron silicide precipitates during phosphorus diffusion gettering and low-temperature annealing. Heavily Fe-contaminated ingot border material contains FeSi2 precipitates after rapid in-line P-diffusion firing, suggesting kinetically limited gettering in these regions. An impurity-to-efficiency (I2E) gettering model is developed to explain the results. The model demonstrates the efficacy of high- and medium-temperature processing on reducing the interstitial iron population over a range of process parameters available to industry.

Original languageEnglish (US)
Title of host publicationConference Record of the IEEE Photovoltaic Specialists Conference
Pages430-431
Number of pages2
DOIs
StatePublished - 2010
Externally publishedYes
Event35th IEEE Photovoltaic Specialists Conference, PVSC 2010 - Honolulu, HI, United States
Duration: Jun 20 2010Jun 25 2010

Other

Other35th IEEE Photovoltaic Specialists Conference, PVSC 2010
CountryUnited States
CityHonolulu, HI
Period6/20/106/25/10

Fingerprint

Microanalysis
Synchrotrons
Precipitates
Solar cells
Iron
Fluorescence microscopy
Ingots
Phosphorus
Annealing
Impurities
X rays
Temperature
Processing
Industry

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Control and Systems Engineering
  • Industrial and Manufacturing Engineering

Cite this

Fenning, D. P., Hofstetter, J., Bertoni, M., Lelièvre, J. F., Del Cañizo, C., & Buonassisi, T. (2010). Synchrotron-based microanalysis of iron distribution after thermal processing and predictive modeling of resulting solar cell efficiency. In Conference Record of the IEEE Photovoltaic Specialists Conference (pp. 430-431). [5616767] https://doi.org/10.1109/PVSC.2010.5616767

Synchrotron-based microanalysis of iron distribution after thermal processing and predictive modeling of resulting solar cell efficiency. / Fenning, D. P.; Hofstetter, J.; Bertoni, Mariana; Lelièvre, J. F.; Del Cañizo, C.; Buonassisi, T.

Conference Record of the IEEE Photovoltaic Specialists Conference. 2010. p. 430-431 5616767.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Fenning, DP, Hofstetter, J, Bertoni, M, Lelièvre, JF, Del Cañizo, C & Buonassisi, T 2010, Synchrotron-based microanalysis of iron distribution after thermal processing and predictive modeling of resulting solar cell efficiency. in Conference Record of the IEEE Photovoltaic Specialists Conference., 5616767, pp. 430-431, 35th IEEE Photovoltaic Specialists Conference, PVSC 2010, Honolulu, HI, United States, 6/20/10. https://doi.org/10.1109/PVSC.2010.5616767
Fenning DP, Hofstetter J, Bertoni M, Lelièvre JF, Del Cañizo C, Buonassisi T. Synchrotron-based microanalysis of iron distribution after thermal processing and predictive modeling of resulting solar cell efficiency. In Conference Record of the IEEE Photovoltaic Specialists Conference. 2010. p. 430-431. 5616767 https://doi.org/10.1109/PVSC.2010.5616767
Fenning, D. P. ; Hofstetter, J. ; Bertoni, Mariana ; Lelièvre, J. F. ; Del Cañizo, C. ; Buonassisi, T. / Synchrotron-based microanalysis of iron distribution after thermal processing and predictive modeling of resulting solar cell efficiency. Conference Record of the IEEE Photovoltaic Specialists Conference. 2010. pp. 430-431
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