Synchrotron-based microanalysis of iron distribution after thermal processing and predictive modeling of resulting solar cell efficiency

D. P. Fenning, J. Hofstetter, M. I. Bertoni, J. F. Lelièvre, C. Del Cañizo, T. Buonassisi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

Synchrotron-based X-ray fluorescence microscopy is applied to study the evolution of iron silicide precipitates during phosphorus diffusion gettering and low-temperature annealing. Heavily Fe-contaminated ingot border material contains FeSi2 precipitates after rapid in-line P-diffusion firing, suggesting kinetically limited gettering in these regions. An impurity-to-efficiency (I2E) gettering model is developed to explain the results. The model demonstrates the efficacy of high- and medium-temperature processing on reducing the interstitial iron population over a range of process parameters available to industry.

Original languageEnglish (US)
Title of host publicationProgram - 35th IEEE Photovoltaic Specialists Conference, PVSC 2010
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages430-431
Number of pages2
ISBN (Print)9781424458912
DOIs
StatePublished - Jan 1 2010
Externally publishedYes

Publication series

NameConference Record of the IEEE Photovoltaic Specialists Conference
ISSN (Print)0160-8371

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Industrial and Manufacturing Engineering
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Synchrotron-based microanalysis of iron distribution after thermal processing and predictive modeling of resulting solar cell efficiency'. Together they form a unique fingerprint.

  • Cite this

    Fenning, D. P., Hofstetter, J., Bertoni, M. I., Lelièvre, J. F., Del Cañizo, C., & Buonassisi, T. (2010). Synchrotron-based microanalysis of iron distribution after thermal processing and predictive modeling of resulting solar cell efficiency. In Program - 35th IEEE Photovoltaic Specialists Conference, PVSC 2010 (pp. 430-431). [5616767] (Conference Record of the IEEE Photovoltaic Specialists Conference). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PVSC.2010.5616767