Surface stress effects on the critical thickness of thin film superlattices

R. C. Cammarata, Karl Sieradzki

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Surface stress represents the reversible work per unit area to elastically stretch a solid surface, and can be associated with interfaces between two solid phases as well as free solid surfaces. The effects of surface stresses on the critical thickness for epitaxy in thin film superlattices is given.

Original languageEnglish (US)
Title of host publicationMaterials Research Society Symposium - Proceedings
EditorsR.L. Crane, J.D. Achenbach, S.P. Shah, T.E. Matikas, P. Khuri-Yakub, R.S. Gilmore
PublisherMRS
Pages475-479
Number of pages5
Volume505
StatePublished - 1998
Externally publishedYes
EventProceedings of the 1997 MRS Fall Meeting - Boston, MA, USA
Duration: Nov 30 1997Dec 4 1997

Other

OtherProceedings of the 1997 MRS Fall Meeting
CityBoston, MA, USA
Period11/30/9712/4/97

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ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

Cite this

Cammarata, R. C., & Sieradzki, K. (1998). Surface stress effects on the critical thickness of thin film superlattices. In R. L. Crane, J. D. Achenbach, S. P. Shah, T. E. Matikas, P. Khuri-Yakub, & R. S. Gilmore (Eds.), Materials Research Society Symposium - Proceedings (Vol. 505, pp. 475-479). MRS.