Surface polarity determination in (110)-orientated compound semiconductors by high-resolution electron microscopy

David Smith, Rob W. Glaisher, Ping Lu

Research output: Contribution to journalArticlepeer-review

14 Scopus citations

Abstract

Several distinctive image features in principle enable the polarity of (110)-oriented compound semiconductors to be determined from high-resolution electron micrographs. In practice, knowledge of objective lens defocus and crystalthickness, and precise control of crystal and beam tilt, are generally required beforeunambiguous discrimination of crystal polarity is possible. Confirmation of surfacepolarity for a (1 x 1) reconstruction of a (110) CdTe surface observed by profileimaging is reported.

Original languageEnglish (US)
Pages (from-to)69-75
Number of pages7
JournalPhilosophical Magazine Letters
Volume59
Issue number2
DOIs
StatePublished - Feb 1989

ASJC Scopus subject areas

  • Condensed Matter Physics

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