Several distinctive image features in principle enable the polarity of (110)-oriented compound semiconductors to be determined from high-resolution electron micrographs. In practice, knowledge of objective lens defocus and crystalthickness, and precise control of crystal and beam tilt, are generally required beforeunambiguous discrimination of crystal polarity is possible. Confirmation of surfacepolarity for a (1 x 1) reconstruction of a (110) CdTe surface observed by profileimaging is reported.
|Original language||English (US)|
|Number of pages||7|
|Journal||Philosophical Magazine Letters|
|State||Published - Feb 1989|
ASJC Scopus subject areas
- Condensed Matter Physics