TY - GEN
T1 - Surface Photovoltage Measurement of Perovskite Solar Cells to Screen Carrier Selective Contacts
AU - Kavadiya, Shalinee
AU - Onno, Arthur
AU - Boyd, Caleb
AU - Yu, Zhengshan
AU - McGehee, Michael
AU - Holman, Zachary C.
N1 - Funding Information:
The information, data, or work presented herein is funded in part by the U.S. Department of Energy PVRD2 program under Award Number DE-EE0008167.
Publisher Copyright:
© 2020 IEEE.
Copyright:
Copyright 2021 Elsevier B.V., All rights reserved.
PY - 2020/6/14
Y1 - 2020/6/14
N2 - SPV measurement through the Kelvin probe method is described. Silicon heterojunction structures show the maximum SPV of 700 V. Measurement on perovskite structures, and the results suggest adding BCP with C60 enhances the selectivity of C60 electron contact. Furthermore, PTAA and PTAA/PFN have similar selectivity but NiOx is poorly selective. SPV is an easy way to provide a relative comparison between various cell structures and contact layers to determine the relative extractable V_{oc} and properties of the contact layer (selectivity, passivation) limiting the efficiency.
AB - SPV measurement through the Kelvin probe method is described. Silicon heterojunction structures show the maximum SPV of 700 V. Measurement on perovskite structures, and the results suggest adding BCP with C60 enhances the selectivity of C60 electron contact. Furthermore, PTAA and PTAA/PFN have similar selectivity but NiOx is poorly selective. SPV is an easy way to provide a relative comparison between various cell structures and contact layers to determine the relative extractable V_{oc} and properties of the contact layer (selectivity, passivation) limiting the efficiency.
KW - Kelvin probe method
KW - Surface photovoltage
KW - carrier selective contacts
KW - perovskite solar cells
KW - silicon solar cells
UR - http://www.scopus.com/inward/record.url?scp=85099576228&partnerID=8YFLogxK
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U2 - 10.1109/PVSC45281.2020.9300489
DO - 10.1109/PVSC45281.2020.9300489
M3 - Conference contribution
AN - SCOPUS:85099576228
T3 - Conference Record of the IEEE Photovoltaic Specialists Conference
SP - 1439
EP - 1440
BT - 2020 47th IEEE Photovoltaic Specialists Conference, PVSC 2020
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 47th IEEE Photovoltaic Specialists Conference, PVSC 2020
Y2 - 15 June 2020 through 21 August 2020
ER -