Abstract

Potential-induced degradation of the shunting type (PID-s) has recently been recognized by the industry as a critical photovoltaic (PV) module durability issue. Many methods to prevent PID-s have been developed at the cell and module levels in the factory and at the system level in the field. This paper presents a prospective method for eliminating or minimizing the PID-s issue either in the factory during manufacturing or in the field after system installation. The method uses commercially available, thin, and flexible Corning Willow Glass sheets or strips on the PV module glass superstrates, disrupting the current leakage path from the cells to the grounded frame.

Original languageEnglish (US)
JournalIEEE Journal of Photovoltaics
DOIs
StateAccepted/In press - Oct 28 2016

Fingerprint

modules
degradation
industrial plants
Degradation
Glass
Industrial plants
glass
Salix
disrupting
cells
durability
Leakage currents
installing
strip
Durability
leakage
manufacturing
industries
Industry

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Cite this

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title = "Surface Disruption Method With Flexible Glass to Prevent Potential-Induced Degradation of the Shunting Type in PV Modules",
abstract = "Potential-induced degradation of the shunting type (PID-s) has recently been recognized by the industry as a critical photovoltaic (PV) module durability issue. Many methods to prevent PID-s have been developed at the cell and module levels in the factory and at the system level in the field. This paper presents a prospective method for eliminating or minimizing the PID-s issue either in the factory during manufacturing or in the field after system installation. The method uses commercially available, thin, and flexible Corning Willow Glass sheets or strips on the PV module glass superstrates, disrupting the current leakage path from the cells to the grounded frame.",
author = "Jaewon Oh and Govindasamy Tamizhmani and Stuart Bowden and Sean Garner",
year = "2016",
month = "10",
day = "28",
doi = "10.1109/JPHOTOV.2016.2618606",
language = "English (US)",
journal = "IEEE Journal of Photovoltaics",
issn = "2156-3381",
publisher = "IEEE Electron Devices Society",

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AU - Oh, Jaewon

AU - Tamizhmani, Govindasamy

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AU - Garner, Sean

PY - 2016/10/28

Y1 - 2016/10/28

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AB - Potential-induced degradation of the shunting type (PID-s) has recently been recognized by the industry as a critical photovoltaic (PV) module durability issue. Many methods to prevent PID-s have been developed at the cell and module levels in the factory and at the system level in the field. This paper presents a prospective method for eliminating or minimizing the PID-s issue either in the factory during manufacturing or in the field after system installation. The method uses commercially available, thin, and flexible Corning Willow Glass sheets or strips on the PV module glass superstrates, disrupting the current leakage path from the cells to the grounded frame.

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