Surface Disruption Method With Flexible Glass to Prevent Potential-Induced Degradation of the Shunting Type in PV Modules

Jaewon Oh, Govindasamy Tamizhmani, Stuart Bowden, Sean Garner

Research output: Contribution to journalArticle

4 Scopus citations

Abstract

Potential-induced degradation of the shunting type (PID-s) has recently been recognized by the industry as a critical photovoltaic (PV) module durability issue. Many methods to prevent PID-s have been developed at the cell and module levels in the factory and at the system level in the field. This paper presents a prospective method for eliminating or minimizing the PID-s issue either in the factory during manufacturing or in the field after system installation. The method uses commercially available, thin, and flexible Corning Willow Glass sheets or strips on the PV module glass superstrates, disrupting the current leakage path from the cells to the grounded frame.

Original languageEnglish (US)
JournalIEEE Journal of Photovoltaics
DOIs
Publication statusAccepted/In press - Oct 28 2016

    Fingerprint

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Cite this