Abstract
It is experimentally shown that, by terminating dangling bonds on Si(001) with a monatomic layer of selenium, the chemical reactivity of the surface is suppressed. In the case of nickel silicidation, transmission electron microscopy (TEM) and x-ray photoelectron spectroscopy reveal that Se passivation suppresses Ni silicidation by over 100°C as compared to the bare Si(001) surface. The formation of Ni subsilicide (Ni2Si) is not observed on Se-passivated Si(001). This interfacial silicidation appears to be linked with changes in electrical behavior of the interface between titanium and Se-passivated Si(001), which we reported previously.
Original language | English (US) |
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Pages (from-to) | 89-92 |
Number of pages | 4 |
Journal | Solid State Communications |
Volume | 132 |
Issue number | 2 |
DOIs | |
State | Published - Oct 2004 |
Externally published | Yes |
Keywords
- A. Silicon
- D. Dangling bond
- D. Surface passivation
- D. Surface reactivity
ASJC Scopus subject areas
- General Chemistry
- Condensed Matter Physics
- Materials Chemistry