Work with a hot stage capable of temperatures of up to 1200°C has shown that charging of insulating materials in a scanning electron microscope can be completely eliminated by heating the sample to several hundred degrees centigrade. A similar scheme was devised to eliminate charging in a secondary‐ion mass spectrometer in order to study oxygen‐18 concentration profiles in MgO. Before and during analysis the sample surface was exposed to a high‐energy electron beam. The mechanism responsible for the elimination of spurious charging is related to surface heating by the electron beam.
|Original language||English (US)|
|Journal||Journal of the American Ceramic Society|
|State||Published - Oct 1985|
ASJC Scopus subject areas
- Ceramics and Composites
- Materials Chemistry