Abstract
Work with a hot stage capable of temperatures of up to 1200°C has shown that charging of insulating materials in a scanning electron microscope can be completely eliminated by heating the sample to several hundred degrees centigrade. A similar scheme was devised to eliminate charging in a secondary‐ion mass spectrometer in order to study oxygen‐18 concentration profiles in MgO. Before and during analysis the sample surface was exposed to a high‐energy electron beam. The mechanism responsible for the elimination of spurious charging is related to surface heating by the electron beam.
Original language | English (US) |
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Pages (from-to) | C‐286-C‐287 |
Journal | Journal of the American Ceramic Society |
Volume | 68 |
Issue number | 10 |
DOIs | |
State | Published - Oct 1985 |
ASJC Scopus subject areas
- Ceramics and Composites
- Materials Chemistry