Supplementary x-ray studies of the Ni-Sn-Bi system

G. P. Vassilev; K. I. Lilova; J. C. Gachon

doi:10.2298/JMMB0702141V

Supplementary x-ray studies of the Ni-Sn-Bi system

G. P. Vassilev, K. I. Lilova, J. C. Gachon

Research output: Contribution to journal › Article › peer-review

13 Scopus citations

Abstract

Phase equilibria were studied in the system Ni-Sn-Bi. Special attention has been paid to the identification of the reacently found ternary phase. For this purpose samples were synthesized using intimately mixed powders. After annealing and quenching, all alloys were analyzed by scanning electron microscope and by X-ray diffraction. The results give evidences about the existence of a ternary compound with approximate formula Ni₆Sn₂Bi to Ni₇Sn₂Bi. Overlapping of some neighbouring diffraction peaks of this phase with NiBi and Ni₃Sn_LT is the reason for the difficulties related to the X-ray diffraction identification of the ternary phase.

Original language	English (US)
Pages (from-to)	141-150
Number of pages	10
Journal	Journal of Mining and Metallurgy, Section B: Metallurgy
Volume	43
Issue number	2
DOIs	https://doi.org/10.2298/JMMB0702141V
State	Published - 2007
Externally published	Yes

Keywords

Ni-Sn-Bi
Phase diagrams
Solders
Ternary compound
X-ray diffraction

ASJC Scopus subject areas

Geotechnical Engineering and Engineering Geology
Mechanics of Materials
Metals and Alloys
Materials Chemistry

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10.2298/JMMB0702141V

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title = "Supplementary x-ray studies of the Ni-Sn-Bi system",

abstract = "Phase equilibria were studied in the system Ni-Sn-Bi. Special attention has been paid to the identification of the reacently found ternary phase. For this purpose samples were synthesized using intimately mixed powders. After annealing and quenching, all alloys were analyzed by scanning electron microscope and by X-ray diffraction. The results give evidences about the existence of a ternary compound with approximate formula Ni6Sn2Bi to Ni7Sn2Bi. Overlapping of some neighbouring diffraction peaks of this phase with NiBi and Ni3Sn_LT is the reason for the difficulties related to the X-ray diffraction identification of the ternary phase.",

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doi = "10.2298/JMMB0702141V",

language = "English (US)",

volume = "43",

pages = "141--150",

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T1 - Supplementary x-ray studies of the Ni-Sn-Bi system

AU - Vassilev, G. P.

AU - Lilova, K. I.

AU - Gachon, J. C.

PY - 2007

Y1 - 2007

N2 - Phase equilibria were studied in the system Ni-Sn-Bi. Special attention has been paid to the identification of the reacently found ternary phase. For this purpose samples were synthesized using intimately mixed powders. After annealing and quenching, all alloys were analyzed by scanning electron microscope and by X-ray diffraction. The results give evidences about the existence of a ternary compound with approximate formula Ni6Sn2Bi to Ni7Sn2Bi. Overlapping of some neighbouring diffraction peaks of this phase with NiBi and Ni3Sn_LT is the reason for the difficulties related to the X-ray diffraction identification of the ternary phase.

AB - Phase equilibria were studied in the system Ni-Sn-Bi. Special attention has been paid to the identification of the reacently found ternary phase. For this purpose samples were synthesized using intimately mixed powders. After annealing and quenching, all alloys were analyzed by scanning electron microscope and by X-ray diffraction. The results give evidences about the existence of a ternary compound with approximate formula Ni6Sn2Bi to Ni7Sn2Bi. Overlapping of some neighbouring diffraction peaks of this phase with NiBi and Ni3Sn_LT is the reason for the difficulties related to the X-ray diffraction identification of the ternary phase.

KW - Ni-Sn-Bi

KW - Phase diagrams

KW - Solders

KW - Ternary compound

KW - X-ray diffraction

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JF - Journal of Mining and Metallurgy, Section B: Metallurgy

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Supplementary x-ray studies of the Ni-Sn-Bi system

Abstract

Keywords

ASJC Scopus subject areas

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