Supplementary x-ray studies of the Ni-Sn-Bi system

G. P. Vassilev, K. I. Lilova, J. C. Gachon

Research output: Contribution to journalArticlepeer-review

12 Scopus citations

Abstract

Phase equilibria were studied in the system Ni-Sn-Bi. Special attention has been paid to the identification of the reacently found ternary phase. For this purpose samples were synthesized using intimately mixed powders. After annealing and quenching, all alloys were analyzed by scanning electron microscope and by X-ray diffraction. The results give evidences about the existence of a ternary compound with approximate formula Ni6Sn2Bi to Ni7Sn2Bi. Overlapping of some neighbouring diffraction peaks of this phase with NiBi and Ni3Sn_LT is the reason for the difficulties related to the X-ray diffraction identification of the ternary phase.

Original languageEnglish (US)
Pages (from-to)141-150
Number of pages10
JournalJournal of Mining and Metallurgy, Section B: Metallurgy
Volume43
Issue number2
DOIs
StatePublished - 2007
Externally publishedYes

Keywords

  • Ni-Sn-Bi
  • Phase diagrams
  • Solders
  • Ternary compound
  • X-ray diffraction

ASJC Scopus subject areas

  • Geotechnical Engineering and Engineering Geology
  • Mechanics of Materials
  • Metals and Alloys
  • Materials Chemistry

Fingerprint

Dive into the research topics of 'Supplementary x-ray studies of the Ni-Sn-Bi system'. Together they form a unique fingerprint.

Cite this