Submillimeter and microwave residual losses in epitaxial films of Y-Ba-Cu-O and Ti-Ca-Ba-Cu-O

D. Miller, P. L. Richards, C. B. Eom, T. H. Geballe, S. M. Garrison, N. Newman, S. Etemad, A. Inam, T. Venkatesan, J. S. Martens, W. Y. Lee, L. C. Bourne

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We have used a novel bolometric technique and a resonant technique to obtain accurate submillimeter and microwave residual loss data for epitaxial thin films of YBa2Cu3O7, Tl2Ca2Ba2Cu3O10 and Tl2CaBa2Cu2O8 for all films we obtain good agreement between the submillimeter and microwave data, with the residual losses in both the Y-Ba-Cu-O and Ti-Ca-Ba-Cu-O films scaling approximately as frequency squared below approx. 1 THz. We are able to fit the losses in the Y-Ba-Cu-O films to a two fluid and a weakly coupled grain model for the a-b plane conductivity, in good agreement with results from a Kramers-Kronig analysis of the loss data.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherPubl by Society of Photo-Optical Instrumentation Engineers
Pages20-21
Number of pages2
ISBN (Print)0819411639
StatePublished - Dec 1 1992
Externally publishedYes
EventProceedings of the 17th International Conference on Infrared and Millimeter Waves - Pasadena, CA, USA
Duration: Dec 14 1992Dec 17 1992

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume1929
ISSN (Print)0277-786X

Other

OtherProceedings of the 17th International Conference on Infrared and Millimeter Waves
CityPasadena, CA, USA
Period12/14/9212/17/92

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ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Miller, D., Richards, P. L., Eom, C. B., Geballe, T. H., Garrison, S. M., Newman, N., Etemad, S., Inam, A., Venkatesan, T., Martens, J. S., Lee, W. Y., & Bourne, L. C. (1992). Submillimeter and microwave residual losses in epitaxial films of Y-Ba-Cu-O and Ti-Ca-Ba-Cu-O. In Proceedings of SPIE - The International Society for Optical Engineering (pp. 20-21). (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 1929). Publ by Society of Photo-Optical Instrumentation Engineers.