@inproceedings{fc308e55157c4993a6e36e34342f7f5f,
title = "Submillimeter and microwave residual losses in epitaxial films of Y-Ba-Cu-O and Ti-Ca-Ba-Cu-O",
abstract = "We have used a novel bolometric technique and a resonant technique to obtain accurate submillimeter and microwave residual loss data for epitaxial thin films of YBa2Cu3O7, Tl2Ca2Ba2Cu3O10 and Tl2CaBa2Cu2O8 for all films we obtain good agreement between the submillimeter and microwave data, with the residual losses in both the Y-Ba-Cu-O and Ti-Ca-Ba-Cu-O films scaling approximately as frequency squared below approx. 1 THz. We are able to fit the losses in the Y-Ba-Cu-O films to a two fluid and a weakly coupled grain model for the a-b plane conductivity, in good agreement with results from a Kramers-Kronig analysis of the loss data.",
author = "D. Miller and Richards, {P. L.} and Eom, {C. B.} and Geballe, {T. H.} and Garrison, {S. M.} and N. Newman and S. Etemad and A. Inam and T. Venkatesan and Martens, {J. S.} and Lee, {W. Y.} and Bourne, {L. C.}",
year = "1992",
language = "English (US)",
isbn = "0819411639",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "Publ by Society of Photo-Optical Instrumentation Engineers",
pages = "20--21",
booktitle = "Proceedings of SPIE - The International Society for Optical Engineering",
note = "Proceedings of the 17th International Conference on Infrared and Millimeter Waves ; Conference date: 14-12-1992 Through 17-12-1992",
}