TY - JOUR
T1 - Sub-300 Å (Bax,Sr1-x)TiO3 films by metal organic chemical vapor deposition
T2 - Nanostructure, step coverage, and dielectric properties
AU - Dey, Sandwip
AU - Majhi, Prashant
AU - Shin, Yong W.
AU - Tang, Derek
AU - Kirby, Aaron
AU - Zhao, Jun
AU - Dornfest, Charles
AU - Lou, Lee
AU - Kher, Shreyas
PY - 2001/5
Y1 - 2001/5
N2 - This is a preliminary report on the nanostructure and its evolution, step-coverage, and dielectric properties of sub-300 Å (Bax, Sr1-x)TiO3 films. The (001)-oriented polycrystalline films were deposited at 50-70 Åmin by metal-organic chemical vapor deposition (MOCVD) on (111) Pt-passivated Si substrates of 8-inch diameter. From the detailed nonstructural characterization of (Ba0.64, Sr0.36)TiO3 films, the orientation, cation stoichiometry, and an alternative but plausible mechanism of growth and the origin of roughness are forwarded. Additionally, the step-coverage in 2 : 1 to 5 : 1 aspect-ratio trenches, coupled with the frequency/voltage dependence of the dielectric properties of (Bax, Sr1-x)TiO3 films are reported. A 275 Å (Ba0.64, Sr0.36)TiO3 film exhibited a dispersionless dielectric permittivity and loss tangent of 260 and 0.003, respectively, and the permittivity (εr = 340) of a 300 Å (Ba0.5, Sr0.5)TiO3 film reduced by 53% at a dc-bias of 3 V.
AB - This is a preliminary report on the nanostructure and its evolution, step-coverage, and dielectric properties of sub-300 Å (Bax, Sr1-x)TiO3 films. The (001)-oriented polycrystalline films were deposited at 50-70 Åmin by metal-organic chemical vapor deposition (MOCVD) on (111) Pt-passivated Si substrates of 8-inch diameter. From the detailed nonstructural characterization of (Ba0.64, Sr0.36)TiO3 films, the orientation, cation stoichiometry, and an alternative but plausible mechanism of growth and the origin of roughness are forwarded. Additionally, the step-coverage in 2 : 1 to 5 : 1 aspect-ratio trenches, coupled with the frequency/voltage dependence of the dielectric properties of (Bax, Sr1-x)TiO3 films are reported. A 275 Å (Ba0.64, Sr0.36)TiO3 film exhibited a dispersionless dielectric permittivity and loss tangent of 260 and 0.003, respectively, and the permittivity (εr = 340) of a 300 Å (Ba0.5, Sr0.5)TiO3 film reduced by 53% at a dc-bias of 3 V.
KW - BST
KW - HRTEM
KW - MOCVD
KW - Nanostructure evolution
KW - Roughness
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U2 - 10.1143/jjap.40.3354
DO - 10.1143/jjap.40.3354
M3 - Article
AN - SCOPUS:0035328437
SN - 0021-4922
VL - 40
SP - 3354
EP - 3358
JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
IS - 5 A
ER -