Sub-10 fs RMS measurement of x-ray/optical delay

M. R. Bionta, J. P. Cryan, J. M. Glownia, D. French, C. Bostedt, M. Cammarrata, J. C. Castagna, Y. Ding, S. M. Durbin, Y. Feng, A. R. Fry, D. J. Kane, J. Krzywinski, H. T. Lemke, M. Messerschmidt, A. Natan, D. F. Ratner, S. Schorb, M. L. Swiggers, M. TrigoW. E. White, R. N. Coffee

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Fingerprint

Dive into the research topics of 'Sub-10 fs RMS measurement of x-ray/optical delay'. Together they form a unique fingerprint.

Engineering & Materials Science

Chemical Compounds