Study of wavelength-resolved light-induced metastable defects in (Ag,Cu)(In,Ga)Se2 thin-films using capacitance based methods

Abhinav Chikhalkar, Michael Goryll, William Shafarman, Richard R. King

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Metastable defects created in silver alloys of copper indium gallium diselenide (ACIGS) are studied using admittance spectroscopy and drive level capacitance profiling (DLCP). Admittance spectroscopy is used to extract the activation energy of the defects and DLCP is used to extract the density and spatial distribution of the defects. The study confirms that addition of silver reduced the drive level density - defined as the sum of the carrier concentration and the defect density - by over two orders of magnitude. The mechanism of formation of light-induced defects in these chalcogenides is probed further by activating the defects using spectrally-resolved light with energy both below and above the device bandgap.

Original languageEnglish (US)
Title of host publication2019 IEEE 46th Photovoltaic Specialists Conference, PVSC 2019
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages2150-2154
Number of pages5
ISBN (Electronic)9781728104942
DOIs
StatePublished - Jun 2019
Event46th IEEE Photovoltaic Specialists Conference, PVSC 2019 - Chicago, United States
Duration: Jun 16 2019Jun 21 2019

Publication series

NameConference Record of the IEEE Photovoltaic Specialists Conference
ISSN (Print)0160-8371

Conference

Conference46th IEEE Photovoltaic Specialists Conference, PVSC 2019
CountryUnited States
CityChicago
Period6/16/196/21/19

Keywords

  • ACIGS
  • admittance spectroscopy
  • CIGS
  • defects
  • drive level capacitance profiling

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Industrial and Manufacturing Engineering
  • Electrical and Electronic Engineering

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