Study of synergism effect between TID and ATREE on the response of the LM124 operational amplifier

Nicolas J.H. Roche, Stephanie Perez, Julien Mekki, Yago Gonzalez Velo, Laurent Dusseau, Jérme Boch, Jean Roch Vaille, Frédéric Saigne, Ronan Marec, Philippe Calvel, Francoise Bezerra, Gérard Auriel, Bruno Azais, Stephen P. Buchner

Research output: Contribution to journalArticle

12 Citations (Scopus)

Abstract

The Synergistic effect between Total Ionizing Dose (TID) and Analog Transient Radiation Effects in Electronics (ATREE) in an operational amplifier (LM124) is investigated. A predictive methodology, based on a previously developed ATREEs simulation tool, is used to model the synergistic phenomena. This phenomenon is simulated for the first time and the duration of the ATREEs' is found to be identical to those measured experimentally. ATREEs induced by high dose-rate X-ray pulses are investigated using a flash X-ray facility. The ATREEs induced in the LM124 operational amplifier configured in three different bias configurations are investigated and simulated.

Original languageEnglish (US)
Article number6084769
Pages (from-to)2890-2897
Number of pages8
JournalIEEE Transactions on Nuclear Science
Volume58
Issue number6 PART 1
DOIs
StatePublished - Dec 1 2011
Externally publishedYes

Fingerprint

operational amplifiers
Radiation effects
Operational amplifiers
radiation effects
Dosimetry
Electronic equipment
analogs
X rays
dosage
electronics
flash
x rays
methodology
configurations
pulses
simulation

Keywords

  • Bipolar analog integrated circuits
  • integrated circuit modeling
  • ionizing dose
  • single event transient
  • transient propagation
  • transient radiation effects
  • transient response

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Nuclear Energy and Engineering
  • Electrical and Electronic Engineering

Cite this

Roche, N. J. H., Perez, S., Mekki, J., Gonzalez Velo, Y., Dusseau, L., Boch, J., ... Buchner, S. P. (2011). Study of synergism effect between TID and ATREE on the response of the LM124 operational amplifier. IEEE Transactions on Nuclear Science, 58(6 PART 1), 2890-2897. [6084769]. https://doi.org/10.1109/TNS.2011.2172630

Study of synergism effect between TID and ATREE on the response of the LM124 operational amplifier. / Roche, Nicolas J.H.; Perez, Stephanie; Mekki, Julien; Gonzalez Velo, Yago; Dusseau, Laurent; Boch, Jérme; Vaille, Jean Roch; Saigne, Frédéric; Marec, Ronan; Calvel, Philippe; Bezerra, Francoise; Auriel, Gérard; Azais, Bruno; Buchner, Stephen P.

In: IEEE Transactions on Nuclear Science, Vol. 58, No. 6 PART 1, 6084769, 01.12.2011, p. 2890-2897.

Research output: Contribution to journalArticle

Roche, NJH, Perez, S, Mekki, J, Gonzalez Velo, Y, Dusseau, L, Boch, J, Vaille, JR, Saigne, F, Marec, R, Calvel, P, Bezerra, F, Auriel, G, Azais, B & Buchner, SP 2011, 'Study of synergism effect between TID and ATREE on the response of the LM124 operational amplifier', IEEE Transactions on Nuclear Science, vol. 58, no. 6 PART 1, 6084769, pp. 2890-2897. https://doi.org/10.1109/TNS.2011.2172630
Roche NJH, Perez S, Mekki J, Gonzalez Velo Y, Dusseau L, Boch J et al. Study of synergism effect between TID and ATREE on the response of the LM124 operational amplifier. IEEE Transactions on Nuclear Science. 2011 Dec 1;58(6 PART 1):2890-2897. 6084769. https://doi.org/10.1109/TNS.2011.2172630
Roche, Nicolas J.H. ; Perez, Stephanie ; Mekki, Julien ; Gonzalez Velo, Yago ; Dusseau, Laurent ; Boch, Jérme ; Vaille, Jean Roch ; Saigne, Frédéric ; Marec, Ronan ; Calvel, Philippe ; Bezerra, Francoise ; Auriel, Gérard ; Azais, Bruno ; Buchner, Stephen P. / Study of synergism effect between TID and ATREE on the response of the LM124 operational amplifier. In: IEEE Transactions on Nuclear Science. 2011 ; Vol. 58, No. 6 PART 1. pp. 2890-2897.
@article{91452404fbb54367a33840a5d72932ea,
title = "Study of synergism effect between TID and ATREE on the response of the LM124 operational amplifier",
abstract = "The Synergistic effect between Total Ionizing Dose (TID) and Analog Transient Radiation Effects in Electronics (ATREE) in an operational amplifier (LM124) is investigated. A predictive methodology, based on a previously developed ATREEs simulation tool, is used to model the synergistic phenomena. This phenomenon is simulated for the first time and the duration of the ATREEs' is found to be identical to those measured experimentally. ATREEs induced by high dose-rate X-ray pulses are investigated using a flash X-ray facility. The ATREEs induced in the LM124 operational amplifier configured in three different bias configurations are investigated and simulated.",
keywords = "Bipolar analog integrated circuits, integrated circuit modeling, ionizing dose, single event transient, transient propagation, transient radiation effects, transient response",
author = "Roche, {Nicolas J.H.} and Stephanie Perez and Julien Mekki and {Gonzalez Velo}, Yago and Laurent Dusseau and J{\'e}rme Boch and Vaille, {Jean Roch} and Fr{\'e}d{\'e}ric Saigne and Ronan Marec and Philippe Calvel and Francoise Bezerra and G{\'e}rard Auriel and Bruno Azais and Buchner, {Stephen P.}",
year = "2011",
month = "12",
day = "1",
doi = "10.1109/TNS.2011.2172630",
language = "English (US)",
volume = "58",
pages = "2890--2897",
journal = "IEEE Transactions on Nuclear Science",
issn = "0018-9499",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "6 PART 1",

}

TY - JOUR

T1 - Study of synergism effect between TID and ATREE on the response of the LM124 operational amplifier

AU - Roche, Nicolas J.H.

AU - Perez, Stephanie

AU - Mekki, Julien

AU - Gonzalez Velo, Yago

AU - Dusseau, Laurent

AU - Boch, Jérme

AU - Vaille, Jean Roch

AU - Saigne, Frédéric

AU - Marec, Ronan

AU - Calvel, Philippe

AU - Bezerra, Francoise

AU - Auriel, Gérard

AU - Azais, Bruno

AU - Buchner, Stephen P.

PY - 2011/12/1

Y1 - 2011/12/1

N2 - The Synergistic effect between Total Ionizing Dose (TID) and Analog Transient Radiation Effects in Electronics (ATREE) in an operational amplifier (LM124) is investigated. A predictive methodology, based on a previously developed ATREEs simulation tool, is used to model the synergistic phenomena. This phenomenon is simulated for the first time and the duration of the ATREEs' is found to be identical to those measured experimentally. ATREEs induced by high dose-rate X-ray pulses are investigated using a flash X-ray facility. The ATREEs induced in the LM124 operational amplifier configured in three different bias configurations are investigated and simulated.

AB - The Synergistic effect between Total Ionizing Dose (TID) and Analog Transient Radiation Effects in Electronics (ATREE) in an operational amplifier (LM124) is investigated. A predictive methodology, based on a previously developed ATREEs simulation tool, is used to model the synergistic phenomena. This phenomenon is simulated for the first time and the duration of the ATREEs' is found to be identical to those measured experimentally. ATREEs induced by high dose-rate X-ray pulses are investigated using a flash X-ray facility. The ATREEs induced in the LM124 operational amplifier configured in three different bias configurations are investigated and simulated.

KW - Bipolar analog integrated circuits

KW - integrated circuit modeling

KW - ionizing dose

KW - single event transient

KW - transient propagation

KW - transient radiation effects

KW - transient response

UR - http://www.scopus.com/inward/record.url?scp=83855165206&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=83855165206&partnerID=8YFLogxK

U2 - 10.1109/TNS.2011.2172630

DO - 10.1109/TNS.2011.2172630

M3 - Article

VL - 58

SP - 2890

EP - 2897

JO - IEEE Transactions on Nuclear Science

JF - IEEE Transactions on Nuclear Science

SN - 0018-9499

IS - 6 PART 1

M1 - 6084769

ER -