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Study of surface and subsurface properties of Si(100) after hydrogen ion-beam exposure
H. X. Liu, T. P. Schneider, J. Montgomery, Y. L. Chen, A. Buczkowski, F. Shimura, R. J. Nemanich, D. M. Maher, D. Korzec, J. Engemann
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
2
Scopus
citations