Study of manufacturing variations impact on TID-ATREEs synergistic effect in LM124 operational amplifier

F. Roig, L. Dusseau, P. Ribeiro, G. Auriel, N. J.H. Roche, A. Privat, J. R. Vaille, J. Boch, F. Saigne, R. Marec, P. Calvel, F. Bezerra, R. Ecoffet, B. Azais

Research output: Chapter in Book/Report/Conference proceedingConference contribution

8 Scopus citations

Abstract

The impact of different manufacturing process and designs on the TID-ATREEs synergistic effect is investigated in the LM124 operational amplifier (opamp) from three different manufacturers. Significant variations were observed on both the Total Ionizing Dose (TID) sensitivity and the Analog Transient Effects on Electronics Effects (ATREE) responses of LM124 devices from different manufacturer. The ATREEs are produced by high dose-rate X-ray pulses using a flash X-ray facility. ATREE modeling results were performed using a previously developed simulation tool.

Original languageEnglish (US)
Title of host publicationProceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781467350570
DOIs
StatePublished - Oct 28 2013
Externally publishedYes
Event2013 14th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2013 - Oxford, United Kingdom
Duration: Sep 23 2013Sep 27 2013

Publication series

NameProceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS

Other

Other2013 14th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2013
CountryUnited Kingdom
CityOxford
Period9/23/139/27/13

Keywords

  • Bipolar analog integrated circuits
  • circuit modeling
  • ionizing dose
  • transient response
  • X-ray effects

ASJC Scopus subject areas

  • Radiation
  • Electrical and Electronic Engineering

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