Study of epitaxial germanium quantum dots in silicon by off-axis electron holography

L. Li, Martha McCartney, David Smith, S. Ketharanathan, Jeffery Drucker

Research output: Contribution to journalArticle

Original languageEnglish (US)
Pages (from-to)404-405
Number of pages2
JournalMicroscopy and Microanalysis
Volume14
Issue numberSUPPL. 2
DOIs
StatePublished - Aug 2008

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Electron holography
Germanium
holography
Semiconductor quantum dots
germanium
quantum dots
Silicon
silicon
electrons

ASJC Scopus subject areas

  • Instrumentation

Cite this

Study of epitaxial germanium quantum dots in silicon by off-axis electron holography. / Li, L.; McCartney, Martha; Smith, David; Ketharanathan, S.; Drucker, Jeffery.

In: Microscopy and Microanalysis, Vol. 14, No. SUPPL. 2, 08.2008, p. 404-405.

Research output: Contribution to journalArticle

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