Study of defects in CdTe heterostructures using imaging confocal photoluminescence and photoluminescence intensity measurements

Craig H. Swartz; Odille C. Noriega; Pathiraja A R D Jayathilaka; Madhavie Edirisooriya; Xin Hao Zhao; Michael J. Dinezza; Shi Liu; Yong-Hang Zhang; Thomas H. Myers

doi:10.1109/PVSC.2014.6925416

Study of defects in CdTe heterostructures using imaging confocal photoluminescence and photoluminescence intensity measurements

Craig H. Swartz, Odille C. Noriega, Pathiraja A R D Jayathilaka, Madhavie Edirisooriya, Xin Hao Zhao, Michael J. Dinezza, Shi Liu, Yong-Hang Zhang, Thomas H. Myers

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

3 Scopus citations

Abstract

Confocal photoluminescence is shown to be a powerful tool for analyzing defect structure in epitaxial CdTe appropriate for photovoltaic applications. Non-radiative defects such as dislocations are easily mapped and quantified. Photoluminescence intensity measurements are shown to be a valuable tool for quantifying interface state density. Very low dislocation density and twin content can be achieved for epitaxial CdTe, and low interface state densities result from using CdMgTe barriers.

Original language	English (US)
Title of host publication	2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	2419-2424
Number of pages	6
ISBN (Electronic)	9781479943982
DOIs	https://doi.org/10.1109/PVSC.2014.6925416
State	Published - Oct 15 2014
Event	40th IEEE Photovoltaic Specialist Conference, PVSC 2014 - Denver, United States Duration: Jun 8 2014 → Jun 13 2014

Publication series

Name	2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014

Other

Other	40th IEEE Photovoltaic Specialist Conference, PVSC 2014
Country	United States
City	Denver
Period	6/8/14 → 6/13/14

Keywords

CdTe
Surface passivation
molecular beam epitaxy
photoluminescence

ASJC Scopus subject areas

Electrical and Electronic Engineering
Electronic, Optical and Magnetic Materials

Access to Document

10.1109/PVSC.2014.6925416

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Cite this

Swartz, C. H., Noriega, O. C., Jayathilaka, P. A. R. D., Edirisooriya, M., Zhao, X. H., Dinezza, M. J., Liu, S., Zhang, Y-H., & Myers, T. H. (2014). Study of defects in CdTe heterostructures using imaging confocal photoluminescence and photoluminescence intensity measurements. In 2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014 (pp. 2419-2424). [6925416] (2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PVSC.2014.6925416

Study of defects in CdTe heterostructures using imaging confocal photoluminescence and photoluminescence intensity measurements. / Swartz, Craig H.; Noriega, Odille C.; Jayathilaka, Pathiraja A R D; Edirisooriya, Madhavie; Zhao, Xin Hao; Dinezza, Michael J.; Liu, Shi; Zhang, Yong-Hang; Myers, Thomas H.

2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014. Institute of Electrical and Electronics Engineers Inc., 2014. p. 2419-2424 6925416 (2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Swartz, CH, Noriega, OC, Jayathilaka, PARD, Edirisooriya, M, Zhao, XH, Dinezza, MJ, Liu, S, Zhang, Y-H & Myers, TH 2014, Study of defects in CdTe heterostructures using imaging confocal photoluminescence and photoluminescence intensity measurements. in 2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014., 6925416, 2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014, Institute of Electrical and Electronics Engineers Inc., pp. 2419-2424, 40th IEEE Photovoltaic Specialist Conference, PVSC 2014, Denver, United States, 6/8/14. https://doi.org/10.1109/PVSC.2014.6925416

Swartz CH, Noriega OC, Jayathilaka PARD, Edirisooriya M, Zhao XH, Dinezza MJ et al. Study of defects in CdTe heterostructures using imaging confocal photoluminescence and photoluminescence intensity measurements. In 2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014. Institute of Electrical and Electronics Engineers Inc. 2014. p. 2419-2424. 6925416. (2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014). https://doi.org/10.1109/PVSC.2014.6925416

Swartz, Craig H. ; Noriega, Odille C. ; Jayathilaka, Pathiraja A R D ; Edirisooriya, Madhavie ; Zhao, Xin Hao ; Dinezza, Michael J. ; Liu, Shi ; Zhang, Yong-Hang ; Myers, Thomas H. / Study of defects in CdTe heterostructures using imaging confocal photoluminescence and photoluminescence intensity measurements. 2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014. Institute of Electrical and Electronics Engineers Inc., 2014. pp. 2419-2424 (2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014).

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AU - Edirisooriya, Madhavie

AU - Zhao, Xin Hao

AU - Dinezza, Michael J.

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AU - Myers, Thomas H.

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KW - molecular beam epitaxy

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