@inproceedings{4acc6b611bad498cbf183697c09ca3ab,
title = "Study of defects in CdTe heterostructures using imaging confocal photoluminescence and photoluminescence intensity measurements",
abstract = "Confocal photoluminescence is shown to be a powerful tool for analyzing defect structure in epitaxial CdTe appropriate for photovoltaic applications. Non-radiative defects such as dislocations are easily mapped and quantified. Photoluminescence intensity measurements are shown to be a valuable tool for quantifying interface state density. Very low dislocation density and twin content can be achieved for epitaxial CdTe, and low interface state densities result from using CdMgTe barriers.",
keywords = "CdTe, Surface passivation, molecular beam epitaxy, photoluminescence",
author = "Swartz, {Craig H.} and Noriega, {Odille C.} and Jayathilaka, {Pathiraja A R D} and Madhavie Edirisooriya and Zhao, {Xin Hao} and Dinezza, {Michael J.} and Shi Liu and Yong-Hang Zhang and Myers, {Thomas H.}",
note = "Publisher Copyright: {\textcopyright} 2014 IEEE. Copyright: Copyright 2018 Elsevier B.V., All rights reserved.; 40th IEEE Photovoltaic Specialist Conference, PVSC 2014 ; Conference date: 08-06-2014 Through 13-06-2014",
year = "2014",
month = oct,
day = "15",
doi = "10.1109/PVSC.2014.6925416",
language = "English (US)",
series = "2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "2419--2424",
booktitle = "2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014",
}