Study of Crystalline Defect Induced Optical Scattering Loss inside AlN Waveguides in UV-Visible Spectral Wavelengths

Hong Chen, Jingan Zhou, Houqiang Fu, Xuanqi Huang, Yuji Zhao

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We study crystalline defect induced scattering loss inside AlN optical waveguides using volume current method. Result indicates that dislocation inside AlN contributes significant scattering loss in UV-visible spectrum wavelengths in certain geometries of waveguides.

Original languageEnglish (US)
Title of host publication2019 Conference on Lasers and Electro-Optics, CLEO 2019 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781943580576
DOIs
StatePublished - May 1 2019
Event2019 Conference on Lasers and Electro-Optics, CLEO 2019 - San Jose, United States
Duration: May 5 2019May 10 2019

Publication series

Name2019 Conference on Lasers and Electro-Optics, CLEO 2019 - Proceedings

Conference

Conference2019 Conference on Lasers and Electro-Optics, CLEO 2019
CountryUnited States
CitySan Jose
Period5/5/195/10/19

Fingerprint

defect
Waveguides
scattering
Scattering
Crystalline materials
waveguides
wavelength
visible spectrum
Wavelength
Defects
defects
Optical waveguides
dislocation
wavelengths
optical waveguides
geometry
Geometry
loss
method

ASJC Scopus subject areas

  • Spectroscopy
  • Industrial and Manufacturing Engineering
  • Safety, Risk, Reliability and Quality
  • Management, Monitoring, Policy and Law
  • Electronic, Optical and Magnetic Materials
  • Radiology Nuclear Medicine and imaging
  • Instrumentation
  • Atomic and Molecular Physics, and Optics

Cite this

Chen, H., Zhou, J., Fu, H., Huang, X., & Zhao, Y. (2019). Study of Crystalline Defect Induced Optical Scattering Loss inside AlN Waveguides in UV-Visible Spectral Wavelengths. In 2019 Conference on Lasers and Electro-Optics, CLEO 2019 - Proceedings [8749725] (2019 Conference on Lasers and Electro-Optics, CLEO 2019 - Proceedings). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.23919/CLEO.2019.8749725

Study of Crystalline Defect Induced Optical Scattering Loss inside AlN Waveguides in UV-Visible Spectral Wavelengths. / Chen, Hong; Zhou, Jingan; Fu, Houqiang; Huang, Xuanqi; Zhao, Yuji.

2019 Conference on Lasers and Electro-Optics, CLEO 2019 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2019. 8749725 (2019 Conference on Lasers and Electro-Optics, CLEO 2019 - Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Chen, H, Zhou, J, Fu, H, Huang, X & Zhao, Y 2019, Study of Crystalline Defect Induced Optical Scattering Loss inside AlN Waveguides in UV-Visible Spectral Wavelengths. in 2019 Conference on Lasers and Electro-Optics, CLEO 2019 - Proceedings., 8749725, 2019 Conference on Lasers and Electro-Optics, CLEO 2019 - Proceedings, Institute of Electrical and Electronics Engineers Inc., 2019 Conference on Lasers and Electro-Optics, CLEO 2019, San Jose, United States, 5/5/19. https://doi.org/10.23919/CLEO.2019.8749725
Chen H, Zhou J, Fu H, Huang X, Zhao Y. Study of Crystalline Defect Induced Optical Scattering Loss inside AlN Waveguides in UV-Visible Spectral Wavelengths. In 2019 Conference on Lasers and Electro-Optics, CLEO 2019 - Proceedings. Institute of Electrical and Electronics Engineers Inc. 2019. 8749725. (2019 Conference on Lasers and Electro-Optics, CLEO 2019 - Proceedings). https://doi.org/10.23919/CLEO.2019.8749725
Chen, Hong ; Zhou, Jingan ; Fu, Houqiang ; Huang, Xuanqi ; Zhao, Yuji. / Study of Crystalline Defect Induced Optical Scattering Loss inside AlN Waveguides in UV-Visible Spectral Wavelengths. 2019 Conference on Lasers and Electro-Optics, CLEO 2019 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2019. (2019 Conference on Lasers and Electro-Optics, CLEO 2019 - Proceedings).
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abstract = "We study crystalline defect induced scattering loss inside AlN optical waveguides using volume current method. Result indicates that dislocation inside AlN contributes significant scattering loss in UV-visible spectrum wavelengths in certain geometries of waveguides.",
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