Strucuture of low loss EELS in Hf and Zr metal, dioxides and silicates

R. Shivaraman; Andrew Chizmeshya; Sandwip Dey; Ray Carpenter

doi:10.1017/S1431927608087308

Strucuture of low loss EELS in Hf and Zr metal, dioxides and silicates

R. Shivaraman, Andrew Chizmeshya, Sandwip Dey, Ray Carpenter

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Pages (from-to)	14-15
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	14
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927608087308
State	Published - Aug 2008

ASJC Scopus subject areas

Instrumentation

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title = "Strucuture of low loss EELS in Hf and Zr metal, dioxides and silicates",

author = "R. Shivaraman and Andrew Chizmeshya and Sandwip Dey and Ray Carpenter",

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AU - Shivaraman, R.

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AU - Dey, Sandwip

AU - Carpenter, Ray

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JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

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Strucuture of low loss EELS in Hf and Zr metal, dioxides and silicates

ASJC Scopus subject areas

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