STRUCTURE OF EXTENDED DEFECT TERMINATIONS IN RUTILE.

David J. Smith, L. A. Bursill, M. G. Blanchin

Research output: Contribution to journalArticlepeer-review

15 Scopus citations

Abstract

High-resolution electron microscopy (HREM) has been used to reveal directly the nature of the termination of crystallographic shear planes (CSPs) in single crystals of reduced rutile. Two types of CSP precipitate on cooling specimens across the TiO//2// minus //x phase boundary. Single (132) CSPs have an extrinsic displacement vector of about one-half LT AN BR 011 OVER BAR RT AN BR , whereas pairs of CSPs have approximately zero net displacement vector, as determined by drawing Burgers circuits directly onto the HREM images. The precipitation mechanism is explained readily in terms of the aggregation of linear cationic interstitial defects. Refs.

Original languageEnglish (US)
Pages (from-to)473-485
Number of pages13
JournalPhilosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
Volume50
Issue number4
StatePublished - Jan 1 1984
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Materials Science(all)
  • Condensed Matter Physics
  • Physics and Astronomy (miscellaneous)
  • Metals and Alloys

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