Structural refinement of α-Bi4V2O11-x(X= 0 and 0·33) using high-resolution electron microscopy

W. Zhou, D. A. Jefferson, H. He, J. Yuan, David Smith

Research output: Contribution to journalArticle

8 Scopus citations

Abstract

α-Bi4V2O11and Bi6V3O16have been prepared by solid state reaction and their structural chemistry has been investigated using X-ray powder diffraction, highresolution electron microscopy, solid-state nuclear magnetic resonance and electron-energy-loss spectroscopy. Their structures are closely related to each other and are both derived from γ-Bi4V2O11with Bi2O2layers partially depressed in an ordered manner, forming various superstructures and implying a location of oxygen vacancies in the Bi2O2layers, rather than the V-O layers as previously believed. These results necessitate a reconsideration of the mechanism of ionic conductivity in these materials.

Original languageEnglish (US)
Pages (from-to)105-110
Number of pages6
JournalPhilosophical Magazine Letters
Volume75
Issue number2
DOIs
StatePublished - Feb 1997

ASJC Scopus subject areas

  • Condensed Matter Physics

Fingerprint Dive into the research topics of 'Structural refinement of α-Bi<sub>4</sub>V<sub>2</sub>O<sub>11-x</sub>(X= 0 and 0·33) using high-resolution electron microscopy'. Together they form a unique fingerprint.

  • Cite this