Structural investigations of SiGe epitaxial layers grown by molecular beam epitaxy on Si(001) and Ge(001) substrates: II - Transmission electron microscopy and atomic force microscopy

N. Faleev, N. Sustersic, N. Bhargava, J. Kolodzey, S. Magonov, David Smith, Christiana Honsberg

Research output: Contribution to journal › Article › peer-review

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