Structural investigations of SiGe epitaxial layers grown by molecular beam epitaxy on Si(0 0 1) and Ge(0 0 1) substrates: I - High-resolution x-ray diffraction and x-ray topography

N. Faleev, N. Sustersic, N. Bhargava, J. Kolodzey, A. Yu Kazimirov, Christiana Honsberg

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