Abstract
The Raman scattering from various model structures for amorphous silicon is computed. It is shown that the width of the optic peak increases roughly linearly with the rms bond-angle distortion b of the network. The experimentally observed linewidths lead to 7.7°b10.5°. The smaller linewidths (and hence angles) correspond to networks that have been annealed at higher temperatures. These results are consistent with model-building experience which shows that it is impossible to construct fully bonded amorphous networks with b6.6°.
Original language | English (US) |
---|---|
Pages (from-to) | 874-878 |
Number of pages | 5 |
Journal | Physical Review B |
Volume | 32 |
Issue number | 2 |
DOIs | |
State | Published - 1985 |
ASJC Scopus subject areas
- Condensed Matter Physics