Structural characterization of SSZ-26 and SSZ-33 molecular sieves by high resolution electron microscopy and electron diffraction

Engineering & Materials Science

• High resolution electron microscopy 100%
• Molecular sieves 85%
• Stacking faults 84%
• Electron diffraction 78%
• Polymorphism 74%
• Image resolution 63%

Physics & Astronomy

• absorbents 73%
• electron microscopy 50%
• electron diffraction 50%
• high resolution 35%
• characterization 32%
• crystal defects 29%
• porosity 21%
• rings 20%

Chemical Compounds

• Stacking Fault 80%
• Electron Diffraction 60%
• Molecular Sieve 59%
• Pore 38%