Structural characterization of niobium oxide thin films grown on SrTiO3 (111) and (La,Sr)(Al,Ta)O3 (111) substrates

Ajit R. Dhamdhere; Tobias Hadamek; Agham B. Posadas; Alexander A. Demkov; David Smith

doi:10.1063/1.4972830

Structural characterization of niobium oxide thin films grown on SrTiO₃ (111) and (La,Sr)(Al,Ta)O₃ (111) substrates

Ajit R. Dhamdhere, Tobias Hadamek, Agham B. Posadas, Alexander A. Demkov, David Smith

Research output: Contribution to journal › Article › peer-review

16 Scopus citations

Abstract

Niobium oxide thin films have been grown by molecular beam epitaxy on SrTiO₃ (STO) (111) and (La_0.18Sr_0.82)(Al_0.59Ta_0.41)O₃ (LSAT) (111) substrates. Transmission electron microscopy (TEM) confirmed the formation of high quality films with coherent interfaces. Films grown with higher oxygen pressure on STO (111) resulted in a (110)-oriented NbO₂ phase with a distorted rutile structure, which can be described as body-centered tetragonal. The a lattice parameter of NbO₂ was determined to be ∼13.8 Å in good agreement with neutron diffraction results published in the literature. Films grown on LSAT (111) at lower oxygen pressure produced the NbO phase with a defective rock salt cubic structure. The NbO lattice parameter was determined to be a ≈ 4.26 Å. The film phase/structure identification from TEM was in good agreement with in situ x-ray photoelectron spectroscopy measurements that confirmed the dioxide and monoxide phases, respectively. The atomic structure of the NbO₂/STO and NbO/LSAT interfaces was determined based on comparisons between high-resolution electron micrographs and image simulations.

Original language	English (US)
Article number	245302
Journal	Journal of Applied Physics
Volume	120
Issue number	24
DOIs	https://doi.org/10.1063/1.4972830
State	Published - Dec 28 2016

ASJC Scopus subject areas

General Physics and Astronomy

Access to Document

10.1063/1.4972830

Cite this

@article{2beba91fcd0e4fcfae7f2956b7455133,

title = "Structural characterization of niobium oxide thin films grown on SrTiO3 (111) and (La,Sr)(Al,Ta)O3 (111) substrates",

abstract = "Niobium oxide thin films have been grown by molecular beam epitaxy on SrTiO3 (STO) (111) and (La0.18Sr0.82)(Al0.59Ta0.41)O3 (LSAT) (111) substrates. Transmission electron microscopy (TEM) confirmed the formation of high quality films with coherent interfaces. Films grown with higher oxygen pressure on STO (111) resulted in a (110)-oriented NbO2 phase with a distorted rutile structure, which can be described as body-centered tetragonal. The a lattice parameter of NbO2 was determined to be ∼13.8 {\AA} in good agreement with neutron diffraction results published in the literature. Films grown on LSAT (111) at lower oxygen pressure produced the NbO phase with a defective rock salt cubic structure. The NbO lattice parameter was determined to be a ≈ 4.26 {\AA}. The film phase/structure identification from TEM was in good agreement with in situ x-ray photoelectron spectroscopy measurements that confirmed the dioxide and monoxide phases, respectively. The atomic structure of the NbO2/STO and NbO/LSAT interfaces was determined based on comparisons between high-resolution electron micrographs and image simulations.",

author = "Dhamdhere, {Ajit R.} and Tobias Hadamek and Posadas, {Agham B.} and Demkov, {Alexander A.} and David Smith",

note = "Funding Information: The authors acknowledge the use of facilities in the John M. Cowley Center for High Resolution Electron Microscopy at Arizona State University. The work at the University of Texas was supported by the Semiconductor Research Corporation under Contract No. 2012-VJ-2299 and National Science Foundation under Grant No. DMR-1507970. Publisher Copyright: {\textcopyright} 2016 Author(s).",

year = "2016",

month = dec,

day = "28",

doi = "10.1063/1.4972830",

language = "English (US)",

volume = "120",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "American Institute of Physics Publising LLC",

number = "24",

}

TY - JOUR

T1 - Structural characterization of niobium oxide thin films grown on SrTiO3 (111) and (La,Sr)(Al,Ta)O3 (111) substrates

AU - Dhamdhere, Ajit R.

AU - Hadamek, Tobias

AU - Posadas, Agham B.

AU - Demkov, Alexander A.

AU - Smith, David

N1 - Funding Information: The authors acknowledge the use of facilities in the John M. Cowley Center for High Resolution Electron Microscopy at Arizona State University. The work at the University of Texas was supported by the Semiconductor Research Corporation under Contract No. 2012-VJ-2299 and National Science Foundation under Grant No. DMR-1507970. Publisher Copyright: © 2016 Author(s).

PY - 2016/12/28

Y1 - 2016/12/28

N2 - Niobium oxide thin films have been grown by molecular beam epitaxy on SrTiO3 (STO) (111) and (La0.18Sr0.82)(Al0.59Ta0.41)O3 (LSAT) (111) substrates. Transmission electron microscopy (TEM) confirmed the formation of high quality films with coherent interfaces. Films grown with higher oxygen pressure on STO (111) resulted in a (110)-oriented NbO2 phase with a distorted rutile structure, which can be described as body-centered tetragonal. The a lattice parameter of NbO2 was determined to be ∼13.8 Å in good agreement with neutron diffraction results published in the literature. Films grown on LSAT (111) at lower oxygen pressure produced the NbO phase with a defective rock salt cubic structure. The NbO lattice parameter was determined to be a ≈ 4.26 Å. The film phase/structure identification from TEM was in good agreement with in situ x-ray photoelectron spectroscopy measurements that confirmed the dioxide and monoxide phases, respectively. The atomic structure of the NbO2/STO and NbO/LSAT interfaces was determined based on comparisons between high-resolution electron micrographs and image simulations.

AB - Niobium oxide thin films have been grown by molecular beam epitaxy on SrTiO3 (STO) (111) and (La0.18Sr0.82)(Al0.59Ta0.41)O3 (LSAT) (111) substrates. Transmission electron microscopy (TEM) confirmed the formation of high quality films with coherent interfaces. Films grown with higher oxygen pressure on STO (111) resulted in a (110)-oriented NbO2 phase with a distorted rutile structure, which can be described as body-centered tetragonal. The a lattice parameter of NbO2 was determined to be ∼13.8 Å in good agreement with neutron diffraction results published in the literature. Films grown on LSAT (111) at lower oxygen pressure produced the NbO phase with a defective rock salt cubic structure. The NbO lattice parameter was determined to be a ≈ 4.26 Å. The film phase/structure identification from TEM was in good agreement with in situ x-ray photoelectron spectroscopy measurements that confirmed the dioxide and monoxide phases, respectively. The atomic structure of the NbO2/STO and NbO/LSAT interfaces was determined based on comparisons between high-resolution electron micrographs and image simulations.

UR - http://www.scopus.com/inward/record.url?scp=85007552434&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85007552434&partnerID=8YFLogxK

U2 - 10.1063/1.4972830

DO - 10.1063/1.4972830

M3 - Article

AN - SCOPUS:85007552434

SN - 0021-8979

VL - 120

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 24

M1 - 245302

ER -

Structural characterization of niobium oxide thin films grown on SrTiO₃ (111) and (La,Sr)(Al,Ta)O₃ (111) substrates

Abstract

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this