Fingerprint
Dive into the research topics of 'Structural breakdown in high power GaN-on-GaN p-n diode devices stressed to failure'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Structural breakdown in high power GaN-on-GaN p-n diode devices stressed to failure
Prudhvi Peri, Kai Fu, Houqiang Fu, Yuji Zhao, David J. Smith
Research output: Contribution to journal › Article › peer-review
4
Scopus
citations