Structural and topological changes in silica glass at pressure

C. J. Benmore, E. Soignard, S. A. Amin, M. Guthrie, S. D. Shastri, P. L. Lee, Jeffery Yarger

Research output: Contribution to journalArticle

114 Scopus citations

Abstract

The effects of high pressures on the structure of silica glass have been elucidated using high-energy x-ray diffraction up to 43.5 GPa. A decrease in the first two peak positions in the real-space pair-distribution functions up to 15 GPa indicates an initial shrinkage of the tetrahedral units. Above this threshold pressure the Si-O bond peak shape becomes asymmetric and the average Si-O bond length and coordination number both increase linearly with pressure. Also, strained geometries in the O-O correlations lead a pronounced topological rearrangement of the second and third nearest neighbors.

Original languageEnglish (US)
Article number054105
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume81
Issue number5
DOIs
StatePublished - Feb 5 2010

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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