Structural and electrical properties of epitaxial YBCO films on Si

D. K. Fork, A. Barrera, Julia M. Phillips, Nathan Newman, D. B. Fenner, T. H. Geballe, G. A N Connell, J. B. Boyce

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Efforts to grow high quality films of YBCO on Si have been discussed. Ion channeling reveals a high degree of crystalline perfection with a channeling minimum yield for Ba as low as 12% on either silicon or SOS. It is possible to produce YBCO films with structural and DC electrical properties which rival the most optimized c-axis epitaxial YBCO films on MgO, SrTiO 3 and LaAlO 3. Preliminary measurements of microwave properties appear promising.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsRajendra Singh, J. Narayan, David T. Shaw
PublisherPubl by Int Soc for Optical Engineering
Pages202
Number of pages1
Volume1394
StatePublished - 1991
Externally publishedYes
EventProgress in High-Temperature Superconducting Transistors and Other Devices - Santa Clara, CA, USA
Duration: Oct 4 1990Oct 5 1990

Other

OtherProgress in High-Temperature Superconducting Transistors and Other Devices
CitySanta Clara, CA, USA
Period10/4/9010/5/90

Fingerprint

Epitaxial films
Structural properties
Electric properties
electrical properties
Microwaves
Crystalline materials
Silicon
Ions
direct current
microwaves
silicon
ions

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Fork, D. K., Barrera, A., Phillips, J. M., Newman, N., Fenner, D. B., Geballe, T. H., ... Boyce, J. B. (1991). Structural and electrical properties of epitaxial YBCO films on Si. In R. Singh, J. Narayan, & D. T. Shaw (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 1394, pp. 202). Publ by Int Soc for Optical Engineering.

Structural and electrical properties of epitaxial YBCO films on Si. / Fork, D. K.; Barrera, A.; Phillips, Julia M.; Newman, Nathan; Fenner, D. B.; Geballe, T. H.; Connell, G. A N; Boyce, J. B.

Proceedings of SPIE - The International Society for Optical Engineering. ed. / Rajendra Singh; J. Narayan; David T. Shaw. Vol. 1394 Publ by Int Soc for Optical Engineering, 1991. p. 202.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Fork, DK, Barrera, A, Phillips, JM, Newman, N, Fenner, DB, Geballe, TH, Connell, GAN & Boyce, JB 1991, Structural and electrical properties of epitaxial YBCO films on Si. in R Singh, J Narayan & DT Shaw (eds), Proceedings of SPIE - The International Society for Optical Engineering. vol. 1394, Publ by Int Soc for Optical Engineering, pp. 202, Progress in High-Temperature Superconducting Transistors and Other Devices, Santa Clara, CA, USA, 10/4/90.
Fork DK, Barrera A, Phillips JM, Newman N, Fenner DB, Geballe TH et al. Structural and electrical properties of epitaxial YBCO films on Si. In Singh R, Narayan J, Shaw DT, editors, Proceedings of SPIE - The International Society for Optical Engineering. Vol. 1394. Publ by Int Soc for Optical Engineering. 1991. p. 202
Fork, D. K. ; Barrera, A. ; Phillips, Julia M. ; Newman, Nathan ; Fenner, D. B. ; Geballe, T. H. ; Connell, G. A N ; Boyce, J. B. / Structural and electrical properties of epitaxial YBCO films on Si. Proceedings of SPIE - The International Society for Optical Engineering. editor / Rajendra Singh ; J. Narayan ; David T. Shaw. Vol. 1394 Publ by Int Soc for Optical Engineering, 1991. pp. 202
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