Strain mapping in nanowires

J. L. Taraci, M. J. Hÿtch, T. Clement, Pedro Peralta, Martha McCartney, Jeffery Drucker, S. T. Picraux

Research output: Contribution to journalArticle

65 Citations (Scopus)

Abstract

A method for obtaining detailed two-dimensional strain maps in nanowires and related nanoscale structures has been developed. The approach relies on a combination of lattice imaging by high-resolution transmission electron microscopy and geometric phase analysis of the resulting micrographs using Fourier transform routines. We demonstrate the method for a germanium nanowire grown epitaxially on Si(111) by obtaining the strain components εxx, εyy, εxy, the mean dilatation, and the rotation of the lattice planes. The resulting strain maps are demonstrated to allow detailed evaluation of the strains and loading on nanowires.

Original languageEnglish (US)
Pages (from-to)2365-2371
Number of pages7
JournalNanotechnology
Volume16
Issue number10
DOIs
StatePublished - Oct 1 2005

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Nanowires
nanowires
Germanium
germanium
High resolution transmission electron microscopy
Fourier transforms
transmission electron microscopy
evaluation
high resolution
Imaging techniques

ASJC Scopus subject areas

  • Engineering (miscellaneous)
  • Materials Science(all)
  • Physics and Astronomy (miscellaneous)

Cite this

Taraci, J. L., Hÿtch, M. J., Clement, T., Peralta, P., McCartney, M., Drucker, J., & Picraux, S. T. (2005). Strain mapping in nanowires. Nanotechnology, 16(10), 2365-2371. https://doi.org/10.1088/0957-4484/16/10/062

Strain mapping in nanowires. / Taraci, J. L.; Hÿtch, M. J.; Clement, T.; Peralta, Pedro; McCartney, Martha; Drucker, Jeffery; Picraux, S. T.

In: Nanotechnology, Vol. 16, No. 10, 01.10.2005, p. 2365-2371.

Research output: Contribution to journalArticle

Taraci, JL, Hÿtch, MJ, Clement, T, Peralta, P, McCartney, M, Drucker, J & Picraux, ST 2005, 'Strain mapping in nanowires', Nanotechnology, vol. 16, no. 10, pp. 2365-2371. https://doi.org/10.1088/0957-4484/16/10/062
Taraci, J. L. ; Hÿtch, M. J. ; Clement, T. ; Peralta, Pedro ; McCartney, Martha ; Drucker, Jeffery ; Picraux, S. T. / Strain mapping in nanowires. In: Nanotechnology. 2005 ; Vol. 16, No. 10. pp. 2365-2371.
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