Strain analysis of InxGa(1-x)N/GaN films by CBIM toward quantification

B. Jiang, L. J. Geng, Fernando Ponce, John Spence

Research output: Contribution to journalArticlepeer-review

Fingerprint Dive into the research topics of 'Strain analysis of In<sub>x</sub>Ga<sub>(1-x)</sub>N/GaN films by CBIM toward quantification'. Together they form a unique fingerprint.