Strain analysis of InxGa(1-x)N/GaN films by CBIM toward quantification

B. Jiang, L. J. Geng, Fernando Ponce, John Spence

Research output: Contribution to journalArticle

Original languageEnglish (US)
Pages (from-to)860-861
Number of pages2
JournalMicroscopy and Microanalysis
Volume9
Issue numberSUPPL. 2
Publication statusPublished - 2003

ASJC Scopus subject areas

  • Instrumentation

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