Strain analysis of InxGa(1-x)N/GaN films by CBIM toward quantification

B. Jiang, L. J. Geng, Fernando Ponce, John Spence

Research output: Contribution to journalArticle

Original languageEnglish (US)
Pages (from-to)860-861
Number of pages2
JournalMicroscopy and Microanalysis
Volume9
Issue numberSUPPL. 2
StatePublished - 2003

ASJC Scopus subject areas

  • Instrumentation

Cite this

Strain analysis of InxGa(1-x)N/GaN films by CBIM toward quantification. / Jiang, B.; Geng, L. J.; Ponce, Fernando; Spence, John.

In: Microscopy and Microanalysis, Vol. 9, No. SUPPL. 2, 2003, p. 860-861.

Research output: Contribution to journalArticle

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