Stochastic analysis of interconnect performance in the presence of process variations

Janet Wang, Praveen Ghanta, Sarma Vrudhula

Research output: Chapter in Book/Report/Conference proceedingConference contribution

78 Scopus citations

Abstract

Deformations in interconnect due to process variations can lead to significant performance degradation in deep submicron circuits. Timing analyzers attempt to capture the effects of variation on delay with simplified models. The timing verification of RC or RLC networks requires the substitution of such simplified models with spatial stochastic processes that capture the random nature of process variations. The present work proposes a new and viable method to compute the stochastic response of interconnects. The technique models the stochastic response in an infinite dimensional Hilbert space in terms of orthogonal polynomial expansions. A finite representation is obtained by using the Galerkin approach of minimizing the Hilbert space norm of the residual error. The key advance of the proposed method is that it provides a functional representation of the response of the system in terms of the random variables that represent the process variations. The proposed algorithm has been implemented in a procedure called OPERA. Results from OPERA simulations on commercial design test cases match well with those from the classical Monte Carlo SPICE simulations and from perturbation methods. Additionally OPERA shows good computational efficiency: speedup factor of 60 has been observed over Monte Carlo SPICE simulations.

Original languageEnglish (US)
Title of host publicationICCAD-2004 - IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers
Pages880-886
Number of pages7
DOIs
StatePublished - Dec 1 2004
Externally publishedYes
EventICCAD-2004 - IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers - San Jose, CA, United States
Duration: Nov 7 2004Nov 11 2004

Publication series

NameIEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD
ISSN (Print)1092-3152

Other

OtherICCAD-2004 - IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers
CountryUnited States
CitySan Jose, CA
Period11/7/0411/11/04

ASJC Scopus subject areas

  • Software
  • Computer Science Applications
  • Computer Graphics and Computer-Aided Design

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  • Cite this

    Wang, J., Ghanta, P., & Vrudhula, S. (2004). Stochastic analysis of interconnect performance in the presence of process variations. In ICCAD-2004 - IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers (pp. 880-886). [11A.2] (IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD). https://doi.org/10.1109/ICCAD.2004.1382698