Stem microanalysis by transmission electron energy loss spectroscopy in crystals

John Spence, J. Lynch

Research output: Contribution to journalArticle

24 Citations (Scopus)

Abstract

The interpretation of microdiffraction patterns from crystals formed with a coherent electron probe which is "smaller" than the crystal unit cell is discussed, with particular reference to the problem of extracting atomic number information. Some characteristic features of the elastic microdiffraction pattern are demonstrated which allow heavy and light atom sites in the crystal to be distinguished. The formation of a STEM lattice image is also discussed. The theory of energy-filtered microdifraction patterns from localized core-loss excitations in crystal is outlined and the characteristic features of these discussed. The form of energy-filtered characteristic loss STEM lattice images is discussed, and the effects of partial localization on these images described. Experimental microdiffraction patterns and energy loss spectra collected at symmetry points within a single unit cell of a barium alumina specimen are used, together with the results of dynamical calculations, to discuss the interpretation and usefulness of filtered microdiffraction patterns and lattice images.

Original languageEnglish (US)
Pages (from-to)267-276
Number of pages10
JournalUltramicroscopy
Volume9
Issue number3
DOIs
StatePublished - 1982

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Electron energy loss spectroscopy
Microanalysis
microanalysis
stems
energy dissipation
electron energy
Crystals
spectroscopy
crystals
Aluminum Oxide
Barium
electron probes
Energy dissipation
cells
Alumina
barium
Atoms
aluminum oxides
Electrons
energy

ASJC Scopus subject areas

  • Materials Science(all)
  • Instrumentation

Cite this

Stem microanalysis by transmission electron energy loss spectroscopy in crystals. / Spence, John; Lynch, J.

In: Ultramicroscopy, Vol. 9, No. 3, 1982, p. 267-276.

Research output: Contribution to journalArticle

@article{06faf8d96db943728e881f81ddf3a754,
title = "Stem microanalysis by transmission electron energy loss spectroscopy in crystals",
abstract = "The interpretation of microdiffraction patterns from crystals formed with a coherent electron probe which is {"}smaller{"} than the crystal unit cell is discussed, with particular reference to the problem of extracting atomic number information. Some characteristic features of the elastic microdiffraction pattern are demonstrated which allow heavy and light atom sites in the crystal to be distinguished. The formation of a STEM lattice image is also discussed. The theory of energy-filtered microdifraction patterns from localized core-loss excitations in crystal is outlined and the characteristic features of these discussed. The form of energy-filtered characteristic loss STEM lattice images is discussed, and the effects of partial localization on these images described. Experimental microdiffraction patterns and energy loss spectra collected at symmetry points within a single unit cell of a barium alumina specimen are used, together with the results of dynamical calculations, to discuss the interpretation and usefulness of filtered microdiffraction patterns and lattice images.",
author = "John Spence and J. Lynch",
year = "1982",
doi = "10.1016/0304-3991(82)90211-X",
language = "English (US)",
volume = "9",
pages = "267--276",
journal = "Ultramicroscopy",
issn = "0304-3991",
publisher = "Elsevier",
number = "3",

}

TY - JOUR

T1 - Stem microanalysis by transmission electron energy loss spectroscopy in crystals

AU - Spence, John

AU - Lynch, J.

PY - 1982

Y1 - 1982

N2 - The interpretation of microdiffraction patterns from crystals formed with a coherent electron probe which is "smaller" than the crystal unit cell is discussed, with particular reference to the problem of extracting atomic number information. Some characteristic features of the elastic microdiffraction pattern are demonstrated which allow heavy and light atom sites in the crystal to be distinguished. The formation of a STEM lattice image is also discussed. The theory of energy-filtered microdifraction patterns from localized core-loss excitations in crystal is outlined and the characteristic features of these discussed. The form of energy-filtered characteristic loss STEM lattice images is discussed, and the effects of partial localization on these images described. Experimental microdiffraction patterns and energy loss spectra collected at symmetry points within a single unit cell of a barium alumina specimen are used, together with the results of dynamical calculations, to discuss the interpretation and usefulness of filtered microdiffraction patterns and lattice images.

AB - The interpretation of microdiffraction patterns from crystals formed with a coherent electron probe which is "smaller" than the crystal unit cell is discussed, with particular reference to the problem of extracting atomic number information. Some characteristic features of the elastic microdiffraction pattern are demonstrated which allow heavy and light atom sites in the crystal to be distinguished. The formation of a STEM lattice image is also discussed. The theory of energy-filtered microdifraction patterns from localized core-loss excitations in crystal is outlined and the characteristic features of these discussed. The form of energy-filtered characteristic loss STEM lattice images is discussed, and the effects of partial localization on these images described. Experimental microdiffraction patterns and energy loss spectra collected at symmetry points within a single unit cell of a barium alumina specimen are used, together with the results of dynamical calculations, to discuss the interpretation and usefulness of filtered microdiffraction patterns and lattice images.

UR - http://www.scopus.com/inward/record.url?scp=0020242295&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0020242295&partnerID=8YFLogxK

U2 - 10.1016/0304-3991(82)90211-X

DO - 10.1016/0304-3991(82)90211-X

M3 - Article

AN - SCOPUS:0020242295

VL - 9

SP - 267

EP - 276

JO - Ultramicroscopy

JF - Ultramicroscopy

SN - 0304-3991

IS - 3

ER -