Statistical tolerance analysis for assured analog test coverage

Sule Ozev, Alex Orailoglu

Research output: Contribution to journalArticle

3 Scopus citations

Abstract

Increasing numbers of analog components in today's systems necessitate system level test composition methods that utilize on-chip capabilities rather than solely relying on costly DFT approaches. We outline a tolerance analysis methodology for test signal propagation to be utilized in hierarchical test generation for analog circuits. A detailed justification of this proposed novel tolerance analysis methodology is undertaken by comparing our results with detailed SPICE Monte-Carlo simulation data on several combinations of analog modules. The results of our experiments confirm the high accuracy and efficiency of the proposed tolerance analysis methodology.

Original languageEnglish (US)
Pages (from-to)173-182
Number of pages10
JournalJournal of Electronic Testing: Theory and Applications (JETTA)
Volume19
Issue number2
DOIs
Publication statusPublished - Apr 2003
Externally publishedYes

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Keywords

  • Analog test
  • Statistical analysis
  • Test signal propagation
  • Tolerance analysis

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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