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Statistical test development for analog circuits under high process variations
Fang Liu,
Sule Ozev
Research output
:
Contribution to journal
›
Article
›
peer-review
31
Scopus citations
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Engineering & Materials Science
Statistical tests
100%
Analog circuits
96%
Networks (circuits)
47%
Analysis of variance (ANOVA)
22%
Automation
16%
Specifications
13%
Experiments
7%