Statistical modeling for predicting degradation of medium voltage outdoor equipment

G. Iyer, R. S. Gorur, A. Krivda, P. Mahonen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

The paper introduces a Weibull probabilistic model for predicting the performance of outdoor medium voltage apparatus using cycloaliphatic epoxies. Rectangular slabs of the material were tested on the inclined plane test (ASTM D2303)for determining the tracking and erosion resistance. Some slabs were sand-blasted to duplicate the degradation observed on fiel-daged samples that were located in various test sites for up to 20 years. Leakage current data was recorded for new and sand-blasted samples during the test. The model is a product of leakage current and arc time at a particular spot as a parameter for the Weibull distribution. The model predictions are in good agreement with the experimental results.

Original languageEnglish (US)
Title of host publicationAnnual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP
Pages274-277
Number of pages4
DOIs
StatePublished - 2009
Event2009 Annual Report Conference on Electrical Insulation and Dielectric Phenomena, CEIDP - Virginia Beach, VA, United States
Duration: Oct 18 2009Oct 21 2009

Other

Other2009 Annual Report Conference on Electrical Insulation and Dielectric Phenomena, CEIDP
CountryUnited States
CityVirginia Beach, VA
Period10/18/0910/21/09

Fingerprint

Leakage currents
Sand
Degradation
Weibull distribution
Electric potential
Erosion
Statistical Models

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

Cite this

Iyer, G., Gorur, R. S., Krivda, A., & Mahonen, P. (2009). Statistical modeling for predicting degradation of medium voltage outdoor equipment. In Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP (pp. 274-277). [5377705] https://doi.org/10.1109/CEIDP.2009.5377705

Statistical modeling for predicting degradation of medium voltage outdoor equipment. / Iyer, G.; Gorur, R. S.; Krivda, A.; Mahonen, P.

Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP. 2009. p. 274-277 5377705.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Iyer, G, Gorur, RS, Krivda, A & Mahonen, P 2009, Statistical modeling for predicting degradation of medium voltage outdoor equipment. in Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP., 5377705, pp. 274-277, 2009 Annual Report Conference on Electrical Insulation and Dielectric Phenomena, CEIDP, Virginia Beach, VA, United States, 10/18/09. https://doi.org/10.1109/CEIDP.2009.5377705
Iyer G, Gorur RS, Krivda A, Mahonen P. Statistical modeling for predicting degradation of medium voltage outdoor equipment. In Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP. 2009. p. 274-277. 5377705 https://doi.org/10.1109/CEIDP.2009.5377705
Iyer, G. ; Gorur, R. S. ; Krivda, A. ; Mahonen, P. / Statistical modeling for predicting degradation of medium voltage outdoor equipment. Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP. 2009. pp. 274-277
@inproceedings{b953b9f4da9e4abb98f639b683f5d99e,
title = "Statistical modeling for predicting degradation of medium voltage outdoor equipment",
abstract = "The paper introduces a Weibull probabilistic model for predicting the performance of outdoor medium voltage apparatus using cycloaliphatic epoxies. Rectangular slabs of the material were tested on the inclined plane test (ASTM D2303)for determining the tracking and erosion resistance. Some slabs were sand-blasted to duplicate the degradation observed on fiel-daged samples that were located in various test sites for up to 20 years. Leakage current data was recorded for new and sand-blasted samples during the test. The model is a product of leakage current and arc time at a particular spot as a parameter for the Weibull distribution. The model predictions are in good agreement with the experimental results.",
author = "G. Iyer and Gorur, {R. S.} and A. Krivda and P. Mahonen",
year = "2009",
doi = "10.1109/CEIDP.2009.5377705",
language = "English (US)",
isbn = "9781424445592",
pages = "274--277",
booktitle = "Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP",

}

TY - GEN

T1 - Statistical modeling for predicting degradation of medium voltage outdoor equipment

AU - Iyer, G.

AU - Gorur, R. S.

AU - Krivda, A.

AU - Mahonen, P.

PY - 2009

Y1 - 2009

N2 - The paper introduces a Weibull probabilistic model for predicting the performance of outdoor medium voltage apparatus using cycloaliphatic epoxies. Rectangular slabs of the material were tested on the inclined plane test (ASTM D2303)for determining the tracking and erosion resistance. Some slabs were sand-blasted to duplicate the degradation observed on fiel-daged samples that were located in various test sites for up to 20 years. Leakage current data was recorded for new and sand-blasted samples during the test. The model is a product of leakage current and arc time at a particular spot as a parameter for the Weibull distribution. The model predictions are in good agreement with the experimental results.

AB - The paper introduces a Weibull probabilistic model for predicting the performance of outdoor medium voltage apparatus using cycloaliphatic epoxies. Rectangular slabs of the material were tested on the inclined plane test (ASTM D2303)for determining the tracking and erosion resistance. Some slabs were sand-blasted to duplicate the degradation observed on fiel-daged samples that were located in various test sites for up to 20 years. Leakage current data was recorded for new and sand-blasted samples during the test. The model is a product of leakage current and arc time at a particular spot as a parameter for the Weibull distribution. The model predictions are in good agreement with the experimental results.

UR - http://www.scopus.com/inward/record.url?scp=77949278299&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=77949278299&partnerID=8YFLogxK

U2 - 10.1109/CEIDP.2009.5377705

DO - 10.1109/CEIDP.2009.5377705

M3 - Conference contribution

SN - 9781424445592

SP - 274

EP - 277

BT - Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP

ER -