Statistical modeling for predicting degradation of medium voltage outdoor equipment

G. Iyer, R. S. Gorur, A. Krivda, P. Mahonen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

The paper introduces a Weibull probabilistic model for predicting the performance of outdoor medium voltage apparatus using cycloaliphatic epoxies. Rectangular slabs of the material were tested on the inclined plane test (ASTM D2303)for determining the tracking and erosion resistance. Some slabs were sand-blasted to duplicate the degradation observed on fiel-daged samples that were located in various test sites for up to 20 years. Leakage current data was recorded for new and sand-blasted samples during the test. The model is a product of leakage current and arc time at a particular spot as a parameter for the Weibull distribution. The model predictions are in good agreement with the experimental results.

Original languageEnglish (US)
Title of host publicationCEIDP - 2009 Annual Report Conference on Electrical Insulation and Dielectric Phenomena
Pages274-277
Number of pages4
DOIs
StatePublished - Dec 1 2009
Event2009 Annual Report Conference on Electrical Insulation and Dielectric Phenomena, CEIDP - Virginia Beach, VA, United States
Duration: Oct 18 2009Oct 21 2009

Publication series

NameAnnual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP
ISSN (Print)0084-9162

Other

Other2009 Annual Report Conference on Electrical Insulation and Dielectric Phenomena, CEIDP
CountryUnited States
CityVirginia Beach, VA
Period10/18/0910/21/09

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ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

Cite this

Iyer, G., Gorur, R. S., Krivda, A., & Mahonen, P. (2009). Statistical modeling for predicting degradation of medium voltage outdoor equipment. In CEIDP - 2009 Annual Report Conference on Electrical Insulation and Dielectric Phenomena (pp. 274-277). [5377705] (Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP). https://doi.org/10.1109/CEIDP.2009.5377705