Statistical methods to determine dominant degradation modes of fielded PV modules

Neelesh Umachandran; Joseph Kuitche; Govindasamy Tamizhmani

doi:10.1109/PVSC.2015.7355699

Statistical methods to determine dominant degradation modes of fielded PV modules

Neelesh Umachandran, Joseph Kuitche, Govindasamy Tamizhmani

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

7 Scopus citations

Abstract

The purpose of this analysis is to identify the most influential degradation modes in the fielded photovoltaic (PV) modules in two different climatic conditions using statistical techniques. This study is based on the measured I-V data and visual inspection data on sampled modules in five different power plants located in Arizona (hot-dry climate) and in New York (cold-dry climate). Statistical tests such as Pearson correlation and hypothesis testing were carried out on degradation rates to identify the parameter(s) that are affected the most. The parameters were also correlated to the visual defects observed in the field to identify the most dominant defect affecting power degradation. Analysis indicates that power is affected the most in hot-dry climate due to solder bond issues leading to high series resistance increase, while encapsulant delamination defect is being predominant in cold-dry climate leading to higher Isc drop and noticeable Voc loss due to triggering of bypass diodes.

Original language	English (US)
Title of host publication	2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781479979448
DOIs	https://doi.org/10.1109/PVSC.2015.7355699
State	Published - Dec 14 2015
Event	42nd IEEE Photovoltaic Specialist Conference, PVSC 2015 - New Orleans, United States Duration: Jun 14 2015 → Jun 19 2015

Other

Other	42nd IEEE Photovoltaic Specialist Conference, PVSC 2015
Country/Territory	United States
City	New Orleans
Period	6/14/15 → 6/19/15

Keywords

correlation
degradation
field modules
statistical
visual defects

ASJC Scopus subject areas

Electrical and Electronic Engineering
Electronic, Optical and Magnetic Materials

Access to Document

10.1109/PVSC.2015.7355699

Cite this

Statistical methods to determine dominant degradation modes of fielded PV modules. / Umachandran, Neelesh; Kuitche, Joseph; Tamizhmani, Govindasamy.
2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015. Institute of Electrical and Electronics Engineers Inc., 2015. 7355699.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Umachandran, N, Kuitche, J & Tamizhmani, G 2015, Statistical methods to determine dominant degradation modes of fielded PV modules. in 2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015., 7355699, Institute of Electrical and Electronics Engineers Inc., 42nd IEEE Photovoltaic Specialist Conference, PVSC 2015, New Orleans, United States, 6/14/15. https://doi.org/10.1109/PVSC.2015.7355699

@inproceedings{7e16ecce3b354b6ab8dedf60d99eab99,

title = "Statistical methods to determine dominant degradation modes of fielded PV modules",

abstract = "The purpose of this analysis is to identify the most influential degradation modes in the fielded photovoltaic (PV) modules in two different climatic conditions using statistical techniques. This study is based on the measured I-V data and visual inspection data on sampled modules in five different power plants located in Arizona (hot-dry climate) and in New York (cold-dry climate). Statistical tests such as Pearson correlation and hypothesis testing were carried out on degradation rates to identify the parameter(s) that are affected the most. The parameters were also correlated to the visual defects observed in the field to identify the most dominant defect affecting power degradation. Analysis indicates that power is affected the most in hot-dry climate due to solder bond issues leading to high series resistance increase, while encapsulant delamination defect is being predominant in cold-dry climate leading to higher Isc drop and noticeable Voc loss due to triggering of bypass diodes.",

keywords = "correlation, degradation, field modules, statistical, visual defects",

author = "Neelesh Umachandran and Joseph Kuitche and Govindasamy Tamizhmani",

year = "2015",

month = dec,

day = "14",

doi = "10.1109/PVSC.2015.7355699",

language = "English (US)",

booktitle = "2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

address = "United States",

note = "42nd IEEE Photovoltaic Specialist Conference, PVSC 2015 ; Conference date: 14-06-2015 Through 19-06-2015",

}

TY - GEN

T1 - Statistical methods to determine dominant degradation modes of fielded PV modules

AU - Umachandran, Neelesh

AU - Kuitche, Joseph

AU - Tamizhmani, Govindasamy

PY - 2015/12/14

Y1 - 2015/12/14

N2 - The purpose of this analysis is to identify the most influential degradation modes in the fielded photovoltaic (PV) modules in two different climatic conditions using statistical techniques. This study is based on the measured I-V data and visual inspection data on sampled modules in five different power plants located in Arizona (hot-dry climate) and in New York (cold-dry climate). Statistical tests such as Pearson correlation and hypothesis testing were carried out on degradation rates to identify the parameter(s) that are affected the most. The parameters were also correlated to the visual defects observed in the field to identify the most dominant defect affecting power degradation. Analysis indicates that power is affected the most in hot-dry climate due to solder bond issues leading to high series resistance increase, while encapsulant delamination defect is being predominant in cold-dry climate leading to higher Isc drop and noticeable Voc loss due to triggering of bypass diodes.

AB - The purpose of this analysis is to identify the most influential degradation modes in the fielded photovoltaic (PV) modules in two different climatic conditions using statistical techniques. This study is based on the measured I-V data and visual inspection data on sampled modules in five different power plants located in Arizona (hot-dry climate) and in New York (cold-dry climate). Statistical tests such as Pearson correlation and hypothesis testing were carried out on degradation rates to identify the parameter(s) that are affected the most. The parameters were also correlated to the visual defects observed in the field to identify the most dominant defect affecting power degradation. Analysis indicates that power is affected the most in hot-dry climate due to solder bond issues leading to high series resistance increase, while encapsulant delamination defect is being predominant in cold-dry climate leading to higher Isc drop and noticeable Voc loss due to triggering of bypass diodes.

KW - correlation

KW - degradation

KW - field modules

KW - statistical

KW - visual defects

UR - http://www.scopus.com/inward/record.url?scp=84961627490&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84961627490&partnerID=8YFLogxK

U2 - 10.1109/PVSC.2015.7355699

DO - 10.1109/PVSC.2015.7355699

M3 - Conference contribution

AN - SCOPUS:84961627490

BT - 2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 42nd IEEE Photovoltaic Specialist Conference, PVSC 2015

Y2 - 14 June 2015 through 19 June 2015

ER -

Statistical methods to determine dominant degradation modes of fielded PV modules

Abstract

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Keywords

ASJC Scopus subject areas

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