Statistical assessment methodology for the design and optimization of cross-point RRAM arrays

Haitong Li, Zizhen Jiang, Peng Huang, Hong Yu Chenl, Bing Chen, Rui Liu, Zhe Chen, Feifei Zhang, Lifeng Liu, Bin Gao, Xiaoyan Liu, Shimeng Yu, H. S Philip Wong, Jinfeng Kang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

9 Scopus citations

Abstract

A comprehensive assessment methodology for the design and optimization of cross-point resistive random access memory (RRAM) arrays is developed based on a simulation platform implementing an RRAM SPICE model with intrinsic variation effects. A statistical assessment of write/read functionality and circuit reliability is performed via quantifying the impact of array-level variations on RRAM memory circuits. Operation reliability including write failure probability and write disturb effect is quantified, with a strategy of choosing bias schemes and a Vdd design tradeoff presented. Circuit/device co-design guidelines and requirements are further extracted based on the assessment of a series of figure-of-merits such as energy-delay product, disturb immunity, and interconnect scaling effect. Finally, an optimized cross-point array configuration is designed to boost circuit performance. The developed assessment flow will pave the way towards robust circuit/device co-design.

Original languageEnglish (US)
Title of host publication2014 IEEE 6th International Memory Workshop, IMW 2014
PublisherIEEE Computer Society
ISBN (Print)9781479935949
DOIs
StatePublished - 2014
Event2014 IEEE 6th International Memory Workshop, IMW 2014 - Taipei, Taiwan, Province of China
Duration: May 18 2014May 21 2014

Publication series

Name2014 IEEE 6th International Memory Workshop, IMW 2014

Other

Other2014 IEEE 6th International Memory Workshop, IMW 2014
CountryTaiwan, Province of China
CityTaipei
Period5/18/145/21/14

Keywords

  • Resistive random access memory (RRAM)
  • cross-point array
  • optimization
  • statistical assessment
  • variation

ASJC Scopus subject areas

  • Software

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