Statistical assessment methodology for the design and optimization of cross-point RRAM arrays

Haitong Li, Zizhen Jiang, Peng Huang, Hong Yu Chenl, Bing Chen, Rui Liu, Zhe Chen, Feifei Zhang, Lifeng Liu, Bin Gao, Xiaoyan Liu, Shimeng Yu, H. S Philip Wong, Jinfeng Kang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)

Abstract

A comprehensive assessment methodology for the design and optimization of cross-point resistive random access memory (RRAM) arrays is developed based on a simulation platform implementing an RRAM SPICE model with intrinsic variation effects. A statistical assessment of write/read functionality and circuit reliability is performed via quantifying the impact of array-level variations on RRAM memory circuits. Operation reliability including write failure probability and write disturb effect is quantified, with a strategy of choosing bias schemes and a Vdd design tradeoff presented. Circuit/device co-design guidelines and requirements are further extracted based on the assessment of a series of figure-of-merits such as energy-delay product, disturb immunity, and interconnect scaling effect. Finally, an optimized cross-point array configuration is designed to boost circuit performance. The developed assessment flow will pave the way towards robust circuit/device co-design.

Original languageEnglish (US)
Title of host publication2014 IEEE 6th International Memory Workshop, IMW 2014
PublisherIEEE Computer Society
ISBN (Print)9781479935949
DOIs
StatePublished - 2014
Event2014 IEEE 6th International Memory Workshop, IMW 2014 - Taipei, Taiwan, Province of China
Duration: May 18 2014May 21 2014

Other

Other2014 IEEE 6th International Memory Workshop, IMW 2014
CountryTaiwan, Province of China
CityTaipei
Period5/18/145/21/14

Fingerprint

Data storage equipment
Networks (circuits)
SPICE

Keywords

  • cross-point array
  • optimization
  • Resistive random access memory (RRAM)
  • statistical assessment
  • variation

ASJC Scopus subject areas

  • Software

Cite this

Li, H., Jiang, Z., Huang, P., Chenl, H. Y., Chen, B., Liu, R., ... Kang, J. (2014). Statistical assessment methodology for the design and optimization of cross-point RRAM arrays. In 2014 IEEE 6th International Memory Workshop, IMW 2014 [6849357] IEEE Computer Society. https://doi.org/10.1109/IMW.2014.6849357

Statistical assessment methodology for the design and optimization of cross-point RRAM arrays. / Li, Haitong; Jiang, Zizhen; Huang, Peng; Chenl, Hong Yu; Chen, Bing; Liu, Rui; Chen, Zhe; Zhang, Feifei; Liu, Lifeng; Gao, Bin; Liu, Xiaoyan; Yu, Shimeng; Wong, H. S Philip; Kang, Jinfeng.

2014 IEEE 6th International Memory Workshop, IMW 2014. IEEE Computer Society, 2014. 6849357.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Li, H, Jiang, Z, Huang, P, Chenl, HY, Chen, B, Liu, R, Chen, Z, Zhang, F, Liu, L, Gao, B, Liu, X, Yu, S, Wong, HSP & Kang, J 2014, Statistical assessment methodology for the design and optimization of cross-point RRAM arrays. in 2014 IEEE 6th International Memory Workshop, IMW 2014., 6849357, IEEE Computer Society, 2014 IEEE 6th International Memory Workshop, IMW 2014, Taipei, Taiwan, Province of China, 5/18/14. https://doi.org/10.1109/IMW.2014.6849357
Li H, Jiang Z, Huang P, Chenl HY, Chen B, Liu R et al. Statistical assessment methodology for the design and optimization of cross-point RRAM arrays. In 2014 IEEE 6th International Memory Workshop, IMW 2014. IEEE Computer Society. 2014. 6849357 https://doi.org/10.1109/IMW.2014.6849357
Li, Haitong ; Jiang, Zizhen ; Huang, Peng ; Chenl, Hong Yu ; Chen, Bing ; Liu, Rui ; Chen, Zhe ; Zhang, Feifei ; Liu, Lifeng ; Gao, Bin ; Liu, Xiaoyan ; Yu, Shimeng ; Wong, H. S Philip ; Kang, Jinfeng. / Statistical assessment methodology for the design and optimization of cross-point RRAM arrays. 2014 IEEE 6th International Memory Workshop, IMW 2014. IEEE Computer Society, 2014.
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