Statistical assessment methodology for the design and optimization of cross-point RRAM arrays

Haitong Li, Zizhen Jiang, Peng Huang, Hong Yu Chenl, Bing Chen, Rui Liu, Zhe Chen, Feifei Zhang, Lifeng Liu, Bin Gao, Xiaoyan Liu, Shimeng Yu, H. S Philip Wong, Jinfeng Kang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Scopus citations

Abstract

A comprehensive assessment methodology for the design and optimization of cross-point resistive random access memory (RRAM) arrays is developed based on a simulation platform implementing an RRAM SPICE model with intrinsic variation effects. A statistical assessment of write/read functionality and circuit reliability is performed via quantifying the impact of array-level variations on RRAM memory circuits. Operation reliability including write failure probability and write disturb effect is quantified, with a strategy of choosing bias schemes and a Vdd design tradeoff presented. Circuit/device co-design guidelines and requirements are further extracted based on the assessment of a series of figure-of-merits such as energy-delay product, disturb immunity, and interconnect scaling effect. Finally, an optimized cross-point array configuration is designed to boost circuit performance. The developed assessment flow will pave the way towards robust circuit/device co-design.

Original languageEnglish (US)
Title of host publication2014 IEEE 6th International Memory Workshop, IMW 2014
PublisherIEEE Computer Society
ISBN (Print)9781479935949
DOIs
StatePublished - Jan 1 2014
Event2014 IEEE 6th International Memory Workshop, IMW 2014 - Taipei, Taiwan, Province of China
Duration: May 18 2014May 21 2014

Publication series

Name2014 IEEE 6th International Memory Workshop, IMW 2014

Other

Other2014 IEEE 6th International Memory Workshop, IMW 2014
CountryTaiwan, Province of China
CityTaipei
Period5/18/145/21/14

Keywords

  • Resistive random access memory (RRAM)
  • cross-point array
  • optimization
  • statistical assessment
  • variation

ASJC Scopus subject areas

  • Software

Fingerprint Dive into the research topics of 'Statistical assessment methodology for the design and optimization of cross-point RRAM arrays'. Together they form a unique fingerprint.

  • Cite this

    Li, H., Jiang, Z., Huang, P., Chenl, H. Y., Chen, B., Liu, R., Chen, Z., Zhang, F., Liu, L., Gao, B., Liu, X., Yu, S., Wong, H. S. P., & Kang, J. (2014). Statistical assessment methodology for the design and optimization of cross-point RRAM arrays. In 2014 IEEE 6th International Memory Workshop, IMW 2014 [6849357] (2014 IEEE 6th International Memory Workshop, IMW 2014). IEEE Computer Society. https://doi.org/10.1109/IMW.2014.6849357