Statistical analysis of random telegraph noise in digital circuits

Xiaoming Chen, Yu Wang, Yu Cao, Huazhong Yang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)

Abstract

Random telegraph noise (RTN) has become an important reliability issue at the sub-65nm technology node. Existing RTN simulation approaches mainly focus on single trap induced RTN and transient response of RTN, which are usually time-consuming for circuit-level simulation. This paper proposes a statistical algorithm to study multiple traps induced RTN in digital circuits, to show the temporal distribution of circuit delay under RTN. Based on the simulation results we show how to protect circuit from RTN. Bias dependence of RTN is also discussed.

Original languageEnglish (US)
Title of host publicationProceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC
Pages161-166
Number of pages6
DOIs
StatePublished - 2014
Event2014 19th Asia and South Pacific Design Automation Conference, ASP-DAC 2014 - Suntec, Singapore
Duration: Jan 20 2014Jan 23 2014

Other

Other2014 19th Asia and South Pacific Design Automation Conference, ASP-DAC 2014
CountrySingapore
CitySuntec
Period1/20/141/23/14

Fingerprint

Telegraph
Digital circuits
Statistical methods
Delay circuits
Networks (circuits)
Transient analysis

Keywords

  • Random telegraph noise
  • Reliability
  • Statistical analysis

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Computer Science Applications
  • Computer Graphics and Computer-Aided Design

Cite this

Chen, X., Wang, Y., Cao, Y., & Yang, H. (2014). Statistical analysis of random telegraph noise in digital circuits. In Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC (pp. 161-166). [6742883] https://doi.org/10.1109/ASPDAC.2014.6742883

Statistical analysis of random telegraph noise in digital circuits. / Chen, Xiaoming; Wang, Yu; Cao, Yu; Yang, Huazhong.

Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC. 2014. p. 161-166 6742883.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Chen, X, Wang, Y, Cao, Y & Yang, H 2014, Statistical analysis of random telegraph noise in digital circuits. in Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC., 6742883, pp. 161-166, 2014 19th Asia and South Pacific Design Automation Conference, ASP-DAC 2014, Suntec, Singapore, 1/20/14. https://doi.org/10.1109/ASPDAC.2014.6742883
Chen X, Wang Y, Cao Y, Yang H. Statistical analysis of random telegraph noise in digital circuits. In Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC. 2014. p. 161-166. 6742883 https://doi.org/10.1109/ASPDAC.2014.6742883
Chen, Xiaoming ; Wang, Yu ; Cao, Yu ; Yang, Huazhong. / Statistical analysis of random telegraph noise in digital circuits. Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC. 2014. pp. 161-166
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