Statistical analysis of commercial c-Si PV module photovoltaic efficiency distribution over 10-years period

Joseph M. Kuitche, Vivek Sharma, Jaewon Oh, Rong Pan, Govindasamy Tamizhmani

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

PV modules are primarily rated at standard test conditions (STC), which corresponds to 1 W/m2 irradiance, 25°C cell temperature, and AM 1.5 spectrum. This paper presents the statistical analyses of efficiency data obtained for over 300 crystalline silicon modules from various manufacturers between 1999 and 2008. Modules were tested at Arizona State University. The objective is (1) to show how the rated efficiencies compare to the measured efficiencies (of manufacturers' supplied modules to a certification laboratory) at STC over time, and (2) to compare measured efficiencies under two other different test conditions: SOC (standard operating condition) and Low E (low irradiance). This paper presents three major findings related to: rated versus measured STC data on manufacturers' supplied modules to a certification laboratory; performance variability over time; and statistical significance of the efficiency increase over the time period considered.

Original languageEnglish (US)
Title of host publicationProgram - 38th IEEE Photovoltaic Specialists Conference, PVSC 2012
Pages2421-2425
Number of pages5
DOIs
StatePublished - Nov 26 2012
Event38th IEEE Photovoltaic Specialists Conference, PVSC 2012 - Austin, TX, United States
Duration: Jun 3 2012Jun 8 2012

Publication series

NameConference Record of the IEEE Photovoltaic Specialists Conference
ISSN (Print)0160-8371

Other

Other38th IEEE Photovoltaic Specialists Conference, PVSC 2012
CountryUnited States
CityAustin, TX
Period6/3/126/8/12

Keywords

  • module efficiency
  • photovoltaic modules

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Industrial and Manufacturing Engineering
  • Electrical and Electronic Engineering

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  • Cite this

    Kuitche, J. M., Sharma, V., Oh, J., Pan, R., & Tamizhmani, G. (2012). Statistical analysis of commercial c-Si PV module photovoltaic efficiency distribution over 10-years period. In Program - 38th IEEE Photovoltaic Specialists Conference, PVSC 2012 (pp. 2421-2425). [6318085] (Conference Record of the IEEE Photovoltaic Specialists Conference). https://doi.org/10.1109/PVSC.2012.6318085