Abstract
In this paper we address the problem of delay constrained minimization of leakage power of CMOS digital circuits for dual V T technology. A novel and efficient heuristic algorithm based on circuit graph enumeration is proposed. The experimental results on the MCNC91 benchmark circuits show that up to an order of magnitude power reduction can be achieved without any increase in delay.
Original language | English (US) |
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Title of host publication | IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers |
Editors | H. Yasuura, J. White |
Publisher | IEEE Comp Soc |
Pages | 490-494 |
Number of pages | 5 |
State | Published - 1998 |
Event | Proceedings of the 1998 IEEE/ACM International Conference on Computer-Aided Design, ICCAD - San Jose, CA, USA Duration: Nov 8 1998 → Nov 12 1998 |
Other
Other | Proceedings of the 1998 IEEE/ACM International Conference on Computer-Aided Design, ICCAD |
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City | San Jose, CA, USA |
Period | 11/8/98 → 11/12/98 |
ASJC Scopus subject areas
- Software