Static analysis to mitigate soft errors in register files

Jongeun Lee, Aviral Shrivastava

Research output: Chapter in Book/Report/Conference proceedingConference contribution

24 Scopus citations

Abstract

With continuous technology scaling, soft errors are becoming an increasingly important design concern even for earth-bound applications. While compiler approaches have the potential to mitigate the effect of soft errors with minimal runtime overheads, static vulnerability estimation-an essential part of compiler approaches-is lacking due to its inherent complexity. This paper presents a static analysis approach for Register File (RF) vulnerability estimation. We decompose the vulnerability of a register into intrinsic and conditional basic-block vulnerabilities. This decomposition allows us to develop a fast, yet reasonably accurate, linear equation-based RF vulnerability estimation mechanism. We demonstrate its practical application to compiler optimizations. Our experimental results on benchmarks from MiBench suite indicate that not only our static RF vulnerability estimation is fast and accurate, but also compiler optimizations enabled by our static estimation can achieve very cost-effective protection of register files against soft errors.

Original languageEnglish (US)
Title of host publicationProceedings - 2009 Design, Automation and Test in Europe Conference and Exhibition, DATE '09
Pages1367-1372
Number of pages6
StatePublished - Oct 22 2009
Event2009 Design, Automation and Test in Europe Conference and Exhibition, DATE '09 - Nice, France
Duration: Apr 20 2009Apr 24 2009

Publication series

NameProceedings -Design, Automation and Test in Europe, DATE
ISSN (Print)1530-1591

Other

Other2009 Design, Automation and Test in Europe Conference and Exhibition, DATE '09
CountryFrance
CityNice
Period4/20/094/24/09

ASJC Scopus subject areas

  • Engineering(all)

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  • Cite this

    Lee, J., & Shrivastava, A. (2009). Static analysis to mitigate soft errors in register files. In Proceedings - 2009 Design, Automation and Test in Europe Conference and Exhibition, DATE '09 (pp. 1367-1372). [5090877] (Proceedings -Design, Automation and Test in Europe, DATE).