Standard Instrument Configuration For Parametric Testing

A. J. Walton; J. M. Robertson; R. Holwill; M. B. Moore

doi:10.1049/el:19850090

Standard Instrument Configuration For Parametric Testing

A. J. Walton, J. M. Robertson, R. Holwill, M. B. Moore

Arizona State University

Research output: Contribution to journal › Article › peer-review

Abstract

A standard configuration for parametric test structures is proposed which can then be measured using instrumentation which is hardwired to the probes. The appropriate connections are made on-chip, which significantly reduces the complexity and expense of the measurement system.

Original language	English (US)
Pages (from-to)	127-128
Number of pages	2
Journal	Electronics Letters
Volume	21
Issue number	4
DOIs	https://doi.org/10.1049/el:19850090
State	Published - Jan 1 1985

Keywords

Instrumentation
Measurement

ASJC Scopus subject areas

Electrical and Electronic Engineering

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10.1049/el:19850090

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title = "Standard Instrument Configuration For Parametric Testing",

abstract = "A standard configuration for parametric test structures is proposed which can then be measured using instrumentation which is hardwired to the probes. The appropriate connections are made on-chip, which significantly reduces the complexity and expense of the measurement system.",

keywords = "Instrumentation, Measurement",

author = "Walton, {A. J.} and Robertson, {J. M.} and R. Holwill and Moore, {M. B.}",

year = "1985",

month = jan,

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doi = "10.1049/el:19850090",

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journal = "Electronics Letters",

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AU - Walton, A. J.

AU - Robertson, J. M.

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AU - Moore, M. B.

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N2 - A standard configuration for parametric test structures is proposed which can then be measured using instrumentation which is hardwired to the probes. The appropriate connections are made on-chip, which significantly reduces the complexity and expense of the measurement system.

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KW - Measurement

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JO - Electronics Letters

JF - Electronics Letters

IS - 4

ER -

Standard Instrument Configuration For Parametric Testing

Abstract

Keywords

ASJC Scopus subject areas

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