STANDARD INSTRUMENT CONFIGURATION FOR PARAMETRIC TESTING.

A. J. Walton, J. M. Robertson, R. Holwill, M. B. Moore

Research output: Contribution to journalArticle

Abstract

A standard configuration for parametric test structures is proposed which can then be measured using instrumentation which is hardwired to the probes. The appropriate connections are made on-chip, which significantly reduces the complexity and expense of the measurement system.

Original languageEnglish (US)
Pages (from-to)127-128
Number of pages2
JournalElectronics Letters
Volume21
Issue number4
StatePublished - Jan 1 1985
Externally publishedYes

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ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Walton, A. J., Robertson, J. M., Holwill, R., & Moore, M. B. (1985). STANDARD INSTRUMENT CONFIGURATION FOR PARAMETRIC TESTING. Electronics Letters, 21(4), 127-128.

STANDARD INSTRUMENT CONFIGURATION FOR PARAMETRIC TESTING. / Walton, A. J.; Robertson, J. M.; Holwill, R.; Moore, M. B.

In: Electronics Letters, Vol. 21, No. 4, 01.01.1985, p. 127-128.

Research output: Contribution to journalArticle

Walton, AJ, Robertson, JM, Holwill, R & Moore, MB 1985, 'STANDARD INSTRUMENT CONFIGURATION FOR PARAMETRIC TESTING.', Electronics Letters, vol. 21, no. 4, pp. 127-128.
Walton AJ, Robertson JM, Holwill R, Moore MB. STANDARD INSTRUMENT CONFIGURATION FOR PARAMETRIC TESTING. Electronics Letters. 1985 Jan 1;21(4):127-128.
Walton, A. J. ; Robertson, J. M. ; Holwill, R. ; Moore, M. B. / STANDARD INSTRUMENT CONFIGURATION FOR PARAMETRIC TESTING. In: Electronics Letters. 1985 ; Vol. 21, No. 4. pp. 127-128.
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