Specimen preparation for scanning-probe microscopy of materials by ultramicrotomy

F. Shaapur, Peter Rez, D. R. Yaniv, G. W. Drach

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

Ultramicrotomy (UM) was used as an alternative specimen preparation method to conventional lapping. Specimens for scanning probe microscopy (SPM) were prepared from a number of powder, particulate and bulk material samples. UM is performed on a trimmed small block of the original material or a particulate material sample embedded in an epoxy resin matrix using an ultramicrotome. An ultramicrotome is a high precision material sectioning system capable of shearing off layers of materials with a thickness variation of less than few tens of Angstroms. This cutting precision makes it possible to prepare ultrathin sections suitable for high resolution transmission electron microscopy.

Original languageEnglish (US)
Title of host publicationProceedings - Annual Meeting, Microscopy Society of America
EditorsG.W. Bailey, A.J. Garratt-Reed
Pages878-879
Number of pages2
StatePublished - 1994
EventProceedings of the 52nd Annual Meeting of the Microscopy Society of America - New Orleans, LA, USA
Duration: Jul 31 1994Aug 5 1994

Other

OtherProceedings of the 52nd Annual Meeting of the Microscopy Society of America
CityNew Orleans, LA, USA
Period7/31/948/5/94

ASJC Scopus subject areas

  • Engineering(all)

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    Shaapur, F., Rez, P., Yaniv, D. R., & Drach, G. W. (1994). Specimen preparation for scanning-probe microscopy of materials by ultramicrotomy. In G. W. Bailey, & A. J. Garratt-Reed (Eds.), Proceedings - Annual Meeting, Microscopy Society of America (pp. 878-879)