Special Session: Physically Flexible Devices for Health and Activity Monitoring: Challenges from Design to Test

Yigit Tuncel, Ganapati Bhat, Umit Y. Ogras

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Recent developments in stretchable and flexible sensing and processing technologies enable a wide range of wearable devices. These devices can pave the way to medical applications ranging from health and activity monitoring to diagnosis and treatments of movement disorders. However, recent studies show that this potential is hindered by both adaptation challenges that affect the end users and technology challenges faced by developers. This paper first summarizes the challenges faced by wearable devices targeting health and user activity monitoring applications. Then, it reviews recent research progress towards addressing these challenges in energy harvesting, energy management, flexible system design, and test areas.

Original languageEnglish (US)
Title of host publicationProceedings - 2020 IEEE 38th VLSI Test Symposium, VTS 2020
PublisherIEEE Computer Society
ISBN (Electronic)9781728153599
DOIs
StatePublished - Apr 2020
Externally publishedYes
Event38th IEEE VLSI Test Symposium, VTS 2020 - San Diego, United States
Duration: Apr 5 2020Apr 8 2020

Publication series

NameProceedings of the IEEE VLSI Test Symposium
Volume2020-April

Conference

Conference38th IEEE VLSI Test Symposium, VTS 2020
CountryUnited States
CitySan Diego
Period4/5/204/8/20

Keywords

  • Activity Monitoring
  • Design and Test
  • Energy Harvesting
  • Energy Management
  • Flexible Electronics
  • Health
  • Wearable Technology

ASJC Scopus subject areas

  • Computer Science Applications
  • Electrical and Electronic Engineering

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  • Cite this

    Tuncel, Y., Bhat, G., & Ogras, U. Y. (2020). Special Session: Physically Flexible Devices for Health and Activity Monitoring: Challenges from Design to Test. In Proceedings - 2020 IEEE 38th VLSI Test Symposium, VTS 2020 [9107559] (Proceedings of the IEEE VLSI Test Symposium; Vol. 2020-April). IEEE Computer Society. https://doi.org/10.1109/VTS48691.2020.9107559